Angular line scanning deflectometry using a laser pico projector

Hao Xun Zhan, Chao Wen Liang, Shih Che Chien

研究成果: 書貢獻/報告類型會議論文篇章同行評審

摘要

In our previous publications, we had successfully made a deflectometry measurement by using a portable laser projector. In this research, we propose the beam weighting centroid method rather than previous the phase shifting method for quantification of the angular direction of the testing beam in the tested optics entrance pupil. By projecting the angular sequential lines on tested optics entrance pupil, the wavefront aberration is reconstructed from two orthogonal directions measurements, in a similar way to the line scanning deflectometry. The limited gray scale problem of laser projector during the phase shifting measurement is therefore eliminated. The reconstructed wavefront is proven to yield a more accurate result than the phase shifting methods at the cost of more image frames and acquisition time.

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主出版物標題Interferometry XVIII
編輯Armando Albertazzi Goncalves, Katherine Creath, Jan Burke
發行者SPIE
ISBN(電子)9781510603110
DOIs
出版狀態已出版 - 2016
事件Interferometry XVIII - San Diego, United States
持續時間: 30 8月 20161 9月 2016

出版系列

名字Proceedings of SPIE - The International Society for Optical Engineering
9960
ISSN(列印)0277-786X
ISSN(電子)1996-756X

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???event.eventtypes.event.conference???Interferometry XVIII
國家/地區United States
城市San Diego
期間30/08/161/09/16

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