Analysis of the back-gate effect in normally OFF p-GaN gate high-electron mobility transistor

Hsien Chin Chiu, Li Yi Peng, Chih Wei Yang, Hsiang Chun Wang, Yue Ming Hsin, Jen Inn Chyi

研究成果: 雜誌貢獻 › 期刊論文 › 同行評審

27 引文 斯高帕斯（Scopus）

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Keyphrases

Engineering

Material Science

Computer Science