@inproceedings{f18f80c2b4b54e5baf93acbb8f573c70,
title = "Analysis of antimony doped SnO 2 thin film by synchrotron grazing incidence X-ray diffraction",
abstract = "In recent years, transparent conductive oxides (TCO) films have been widely used for solar cell due to its high transmittance, low sheet resistance and texture structure that could increase the efficiency. The purpose of this study is to analyze the amount of antimony doped in tin oxide thin films by synchrotron radiation grazing incidence X-Ray diffraction (GIXRD), which is a non-destructive testing method to measure the variations in lattice constant due to the doped antimony atoms. The physical properties, such as resistivity, hall mobility, carrier concentration, transmittance, haze were measured to discuss the enhancement from the dopants. The result of this research showed that the resistivity of the film was 1.4×10 -3 Ω-cm and the average transmittance from 400nm to 800nm could reach 89.3% with the doping of antimony.",
author = "Lin, {Yang Yi} and Wu, {Albert T.} and Ku, {Ching Shun} and Lee, {Hsin Yi}",
year = "2011",
doi = "10.1109/PVSC.2011.6186296",
language = "???core.languages.en_GB???",
isbn = "9781424499656",
series = "Conference Record of the IEEE Photovoltaic Specialists Conference",
pages = "1768--1770",
booktitle = "Program - 37th IEEE Photovoltaic Specialists Conference, PVSC 2011",
note = "37th IEEE Photovoltaic Specialists Conference, PVSC 2011 ; Conference date: 19-06-2011 Through 24-06-2011",
}