摘要
In this paper a generalized Eyring model is used to describe the dependence of performance, aging and accelerated stresses in a power supply. The tests considered here involve multiple measurements collected by automatic monitor system in a two-way design. The expected time to failure of a power supply at the use condition is estimated.
| 原文 | ???core.languages.en_GB??? |
|---|---|
| 頁（從 - 到） | 65-69 |
| 頁數 | 5 |
| 期刊 | Reliability Engineering and System Safety |
| 卷 | 39 |
| 發行號 | 1 |
| DOIs | |
| 出版狀態 | 已出版 - 1993 |