In this paper a generalized Eyring model is used to describe the dependence of performance, aging and accelerated stresses in a power supply. The tests considered here involve multiple measurements collected by automatic monitor system in a two-way design. The expected time to failure of a power supply at the use condition is estimated.
|頁（從 - 到）||65-69|
|期刊||Reliability Engineering and System Safety|
|出版狀態||已出版 - 1993|