An Incremental Meta Defect Detection System for Printed Circuit Boards

Jia Jiun Gung, Chia Yu Lin, Pin Fan Lin, Wei Kuang Chung

研究成果: 書貢獻/報告類型會議論文篇章同行評審

2 引文 斯高帕斯(Scopus)

摘要

Defect detection is essential in production lines to guarantee the quality of products. However, detecting tiny defects is difficult. Besides, as the variety of products increases, the variety of defects also increases. Models take much time to retrain. In this paper, we propose an 'Incremental Meta Defect Detection (IMDD) System,' which utilizes incremental meta-learning to detect tiny defects. We decompose the model into feature pyramids and use feature alignment to improve the sensitivity of minor defects. Incremental learning utilizes knowledge distillation but this affects the learning of new categories, so the model is quickly adapted to new categories. We further combine incremental learning with meta-learning to increase the generality of the model. In experiments, the proposed model is 1.14 times more accurate than previous techniques. Therefore, the proposed system can enhance the ability to identify minor defects and quickly adapt to new defect types.

原文???core.languages.en_GB???
主出版物標題Proceedings - 2022 IEEE International Conference on Consumer Electronics - Taiwan, ICCE-Taiwan 2022
發行者Institute of Electrical and Electronics Engineers Inc.
頁面307-308
頁數2
ISBN(電子)9781665470506
DOIs
出版狀態已出版 - 2022
事件2022 IEEE International Conference on Consumer Electronics - Taiwan, ICCE-Taiwan 2022 - Taipei, Taiwan
持續時間: 6 7月 20228 7月 2022

出版系列

名字Proceedings - 2022 IEEE International Conference on Consumer Electronics - Taiwan, ICCE-Taiwan 2022

???event.eventtypes.event.conference???

???event.eventtypes.event.conference???2022 IEEE International Conference on Consumer Electronics - Taiwan, ICCE-Taiwan 2022
國家/地區Taiwan
城市Taipei
期間6/07/228/07/22

指紋

深入研究「An Incremental Meta Defect Detection System for Printed Circuit Boards」主題。共同形成了獨特的指紋。

引用此