摘要
Embedded cores are being increasingly used in the design of large System-on-a-Chip (SoC). Because of the high complexity of SoC, the design verification is a challenge for system integrator. To reduce the verification complexity, the port order fault (POF) model proposed in [1] has been used for verifying core-based designs and the corresponding verification pattern generation have been developed [2] [3]. Here we present an automorphic technique to improve the efficiency of the automatic verification pattern generation (AVPG) proposed in [3] for SoC design verification based on POF model. On average, the size of pattern sets obtained on the ISCAS-85 and MCNC benchmarks are 45% smaller and the run time decreases 16% as compared with the results of AVPG.
原文 | ???core.languages.en_GB??? |
---|---|
頁(從 - 到) | 431-436 |
頁數 | 6 |
期刊 | Proceedings of the Asian Test Symposium |
出版狀態 | 已出版 - 2001 |
事件 | Proceedings of the 10th Asian Test Symposium - Kyoto, Japan 持續時間: 19 11月 2001 → 21 11月 2001 |