An equivalent-circuit modelling on vertical and horizontal integrations for MOS flat-band voltage simulation

Chia Cherng Chang, Szu Ju Li, Yao Tsung Tsai

研究成果: 雜誌貢獻期刊論文同行評審

摘要

The fixed oxide charge will cause the MOS capacitor (MOS-C) flat-band voltage to shift. We can observe the potential distribution to determine the MOS-C flat-band voltage. However, the potential distribution can be obtained from the integration of the electric field distribution. The integration of the electric field distribution is classified into the vertical and horizontal integrations. In this paper, we use the equivalent-circuit model to demonstrate the flat-band voltage of the non-ideal MOS-C. The equivalent-circuit model of Poisson's equation includes two fixed charges Q′f1 and Q′f2 in the oxide layer region. Because the horizontal integration method is the superposition method, the equivalent-circuit model for the horizontal integration is divided into 3 types. Hence, the flat-band voltage for the horizontal integration is equal to the sum of the V G1, VG2, and VG3 for the flat-band condition. By comparison, the simulation results of the horizontal integration method approximate to the vertical integration method.

原文???core.languages.en_GB???
頁(從 - 到)289-300
頁數12
期刊International Journal of Numerical Modelling: Electronic Networks, Devices and Fields
19
發行號3
DOIs
出版狀態已出版 - 5月 2006

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