An efficient diagnosis scheme for random access memories

Keyphrases

• Random Access Memory 100%
• Diagnosis Scheme 100%
• Aggressor 80%
• Write Operation 40%
• Bit-oriented 40%
• Low Computational Complexity 20%
• Fault Diagnosis 20%
• Fault Location 20%
• Yield Improvement 20%
• Diagnostic Process 20%
• Memory Yield 20%
• Coupling Faults 20%
• Diagnostic Resolution 20%
• Diagnosis Approach 20%

Computer Science

• Random Access Memory 100%
• Write Operation 100%
• Time Complexity 50%
• Fault Diagnosis 50%
• Fault Location 50%

Engineering

• Random Access Memory 100%
• Reliability Availability and Maintainability (Reliability Engineering) 100%
• Fault Diagnosis 50%
• Bit Word 50%