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An Artificial Intelligence Based Defect Detection System for Transparent Substrate
Kai Yu Lin,
Pi Cheng Tung
,
Chih Kuang Lin
機械工程學系
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Keyphrases
Artificial Intelligence
100%
Transparent Substrate
100%
YOLOv4
100%
Defect Detection System
100%
Automated Optical Inspection
85%
Optical Inspection System
42%
Glass Substrate
28%
Defect Detection
28%
Imaging Algorithm
28%
Image Acquisition System
28%
Anchor Box
28%
YOLOv4-tiny
28%
Custom Dataset
28%
Artificial Intelligence Techniques
14%
Light Source
14%
Model Performance
14%
Pollution
14%
Image Quality
14%
High Quality Images
14%
Dust Particles
14%
Visual Inspection
14%
Inspection System
14%
Cloth
14%
Defect Type
14%
Digital Image Processing
14%
5-fold Cross Validation
14%
Accurate Model
14%
Batting
14%
Input Size
14%
Gray Difference
14%
YOLOv4 Model
14%
YOLOv4-CSP
14%
Box-constrained Optimization
14%
Inspection Checklist
14%
Engineering
Defect Detection
100%
Automated Optical Inspection
100%
Artificial Intelligence
100%
Acquisition System
33%
Image Processing Algorithm
33%
Glass Substrate
33%
Image Processing
16%
Light Source
16%
Grey Level
16%
Input Image
16%
Test Dataset
16%
Visual Inspection
16%
Material Science
Dust Particle
100%