@inproceedings{8aa78f3dc4924b0bb8faf13360b37b24,
title = "An Aging Detection and Tolerance Framework for 8T SRAM Dot Product CIM Engine",
abstract = "Computing In-Memory (CIM), which directly performs in-situ operations at memory, is one of the promising solutions to overcome von Neumann bottleneck. Previous researchers have proposed an 8T-SRAM-based CIM structure to perform dot product (DP) computations by analog charging/discharging operations. However, CIM structure may suffer from variations and aging effects such as BTI and HCI, which threat the reliability of CIM operation results. In this paper, we propose an agingaware CIM operation framework which consists of an aging detection method and an aging tolerance technique. Specifically, we apply Dynamic Voltage Scaling (DVS) on affected CIM structure to compensate the current drop due to variations and aging effects. Experimental results show that our method can successfully calibrate dropped current and thus maintain the reliability of CIM operations.",
keywords = "8T SRAM, Aging, Computing In-Memory, DVS",
author = "Chen, {Yu Guang} and Wang, {Chi Hsu} and Lin, {Ing Chao}",
note = "Publisher Copyright: {\textcopyright} 2022 IEEE.; 19th International System-on-Chip Design Conference, ISOCC 2022 ; Conference date: 19-10-2022 Through 22-10-2022",
year = "2022",
doi = "10.1109/ISOCC56007.2022.10031538",
language = "???core.languages.en_GB???",
series = "Proceedings - International SoC Design Conference 2022, ISOCC 2022",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "161--162",
booktitle = "Proceedings - International SoC Design Conference 2022, ISOCC 2022",
}