摘要
N-p-n abrupt AlGaAs/GaAs heterojunction bipolar transistors (HBTs) with a 500 Å-thick GaAs base, and regrown thick extrinsic base layers of p+ AlGaAs/GaAs have been fabricated. The regrown extrinsic base layers allow easy contact to the base with low base resistance to achieve high fmax. fmax; was improved by a factor of ∼ 2 with regrown base compared to conventional processing, up to a value of 45 GHz in these non-self-aligned devices. The extrinsic base regrowth was done at 500°C by MOMBE, which employed low-temperature in situ etch using tris-dimethylaminoarsenic to remove residual oxide from the surface before regrowth.
原文 | ???core.languages.en_GB??? |
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頁(從 - 到) | 355-358 |
頁數 | 4 |
期刊 | Journal of Crystal Growth |
卷 | 188 |
發行號 | 1-4 |
DOIs | |
出版狀態 | 已出版 - 1 6月 1998 |