AlGaAs/GaAs HBTs with extrinsic base regrowth

Y. M. Hsin, N. Y. Li, C. W. Tu, P. M. Asbeck

研究成果: 雜誌貢獻期刊論文同行評審

1 引文 斯高帕斯(Scopus)

摘要

N-p-n abrupt AlGaAs/GaAs heterojunction bipolar transistors (HBTs) with a 500 Å-thick GaAs base, and regrown thick extrinsic base layers of p+ AlGaAs/GaAs have been fabricated. The regrown extrinsic base layers allow easy contact to the base with low base resistance to achieve high fmax. fmax; was improved by a factor of ∼ 2 with regrown base compared to conventional processing, up to a value of 45 GHz in these non-self-aligned devices. The extrinsic base regrowth was done at 500°C by MOMBE, which employed low-temperature in situ etch using tris-dimethylaminoarsenic to remove residual oxide from the surface before regrowth.

原文???core.languages.en_GB???
頁(從 - 到)355-358
頁數4
期刊Journal of Crystal Growth
188
發行號1-4
DOIs
出版狀態已出版 - 1 6月 1998

指紋

深入研究「AlGaAs/GaAs HBTs with extrinsic base regrowth」主題。共同形成了獨特的指紋。

引用此