@inproceedings{751c0c2139ec4797a0022d5d76150a5b,
title = "Adaptive de-noising filter algorithm for CMOS image sensor testing applications",
abstract = "This paper proposes an adaptive de-nosing filter (ADF) algorithm to effectively remove the image defects for the CMOS image sensor testing applications. Based on the median filter technique, the proposed ADF algorithm develops a pre-processing method to generate adaptive detection windows for pixel defect de-noising of an image. Experimental results and comparisons show that the proposed ADF algorithm can provide a significant ability of defects de-noising for supporting good performance in peak signal-to-noise ratio (PSNR) and image quality.",
author = "Hsu, {Chun Lung} and Lan, {Chen Wei} and Lo, {Yu Chih} and Huang, {Yu Sheng}",
year = "2010",
doi = "10.1109/DFT.2010.23",
language = "???core.languages.en_GB???",
isbn = "9780769542430",
series = "Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems",
pages = "136--143",
booktitle = "Proceedings - 2010 25th International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2010",
note = "2010 25th International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2010 ; Conference date: 06-10-2010 Through 08-10-2010",
}