摘要
Due to the high attenuation in vitreous silica, acoustic attenuations in the THz regime are typically measured by incoherent techniques such as Raman, neutron, and X-ray scattering. Here, we utilized multiple-quantum-well structures to demonstrate acoustic spectroscopy of vitreous silica up to ∼740 THz. The acoustic properties of silica thin films prepared by physical and chemical deposition methods were characterized in the sub-THz regime. This technique can be useful in resolving debated issues relating to Boson peak around 1 THz.
原文 | ???core.languages.en_GB??? |
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文章編號 | 072126 |
期刊 | AIP Advances |
卷 | 3 |
發行號 | 7 |
DOIs | |
出版狀態 | 已出版 - 7月 2013 |