摘要
The analysis on test beam data of a large silicon microstrip detector is presented. The spatial resolution has been studied with full GEANT simulation to calculate the systematic uncertainty due to multiple scattering. Several cluster position-finding algorithms have been applied for inclined tracks. The cluster profile and spatial resolution have the predicted geometrical correlation to the track angle.
原文 | ???core.languages.en_GB??? |
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頁(從 - 到) | 538-544 |
頁數 | 7 |
期刊 | Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment |
卷 | 363 |
發行號 | 3 |
DOIs | |
出版狀態 | 已出版 - 11 9月 1995 |