A study of the charge cluster characteristics and spatial resolution of a silicon microstrip detector

Yuan Hann Chang, Augustine E. Chen, Suen R. Hou, Willis T. Lin

研究成果: 雜誌貢獻期刊論文同行評審

12 引文 斯高帕斯(Scopus)

摘要

The analysis on test beam data of a large silicon microstrip detector is presented. The spatial resolution has been studied with full GEANT simulation to calculate the systematic uncertainty due to multiple scattering. Several cluster position-finding algorithms have been applied for inclined tracks. The cluster profile and spatial resolution have the predicted geometrical correlation to the track angle.

原文???core.languages.en_GB???
頁(從 - 到)538-544
頁數7
期刊Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
363
發行號3
DOIs
出版狀態已出版 - 11 9月 1995

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