@inproceedings{3bf44dc9df4a40819adb27f7e734f3e4,

title = "A single-state-transition fault model for sequential machines",

abstract = "A fault model in the state transition level of finite state machines is studied. In this model, called a single-state-transition (SST) fault model, a fault causes a state transition to go to a wrong destination state while leaving its input/output label intact. An analysis is given to show that a test set that detects all SST faults will also detect most multiple-state-transition (MST) faults in practical finite state machines. It is shown that, for a N-state M-transition machine, the length of the SST fault test set is upper-bounded by 2 × M × N2 while the length is exponential in terms of N for a checking experiment. Experimental results show that the test set generated for SST faults achieves not only a high single stuck-at fault coverage but also a high transistor fault coverage for a multilevel implementation of the machine.",

author = "Cheng, {Kwang Ting} and Jou, {Jing Yang}",

year = "1990",

language = "???core.languages.en_GB???",

isbn = "0818620552",

series = "1990 IEEE International Conference on Computer-Aided Design. Digest of Technical Papers",

publisher = "Publ by IEEE",

pages = "226--229",

booktitle = "1990 IEEE International Conference on Computer-Aided Design. Digest of Technical Papers",

note = "1990 IEEE International Conference on Computer-Aided Design - ICCAD-90 ; Conference date: 11-11-1990 Through 15-11-1990",

}