A single-state-transition fault model for sequential machines

Kwang Ting Cheng, Jing Yang Jou

研究成果: 書貢獻/報告類型會議論文篇章同行評審

21 引文 斯高帕斯(Scopus)

摘要

A fault model in the state transition level of finite state machines is studied. In this model, called a single-state-transition (SST) fault model, a fault causes a state transition to go to a wrong destination state while leaving its input/output label intact. An analysis is given to show that a test set that detects all SST faults will also detect most multiple-state-transition (MST) faults in practical finite state machines. It is shown that, for a N-state M-transition machine, the length of the SST fault test set is upper-bounded by 2 × M × N2 while the length is exponential in terms of N for a checking experiment. Experimental results show that the test set generated for SST faults achieves not only a high single stuck-at fault coverage but also a high transistor fault coverage for a multilevel implementation of the machine.

原文???core.languages.en_GB???
主出版物標題1990 IEEE International Conference on Computer-Aided Design. Digest of Technical Papers
發行者Publ by IEEE
頁面226-229
頁數4
ISBN(列印)0818620552
出版狀態已出版 - 1990
事件1990 IEEE International Conference on Computer-Aided Design - ICCAD-90 - Santa Clara, CA, USA
持續時間: 11 11月 199015 11月 1990

出版系列

名字1990 IEEE International Conference on Computer-Aided Design. Digest of Technical Papers

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???event.eventtypes.event.conference???1990 IEEE International Conference on Computer-Aided Design - ICCAD-90
城市Santa Clara, CA, USA
期間11/11/9015/11/90

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