摘要
This work investigates a pseudo-junction barrier Schottky (pseudo-JBS) diode that is created by placing an AlGaN/GaN Schottky diode in parallel with a p-GaN junction on the same epitaxial p-GaN gate AlGaN/GaN high electron mobility transistor (HEMT) wafer. This pseudo-JBS diode employs the two-dimentional electron gas to increase the operation current, thus reducing the on-resistance with high blocking voltage. The fabricated pseudo-JBS diode with anode-to-cathode lengths (LAC) of 10 μm shows a turn-on voltage of 1.05 V, a minimum specific on-resistance (RON,MIN) of 2.53 mΩ cm2, and blocking voltage of 1112 V yielding an excellent Baliga's figure of merit of 488.7 MW cm−2 on the same epitaxial p-GaN/AlGaN/GaN HEMT wafer. This study provides a promising substitute for Schottky barrier diodes without requiring extra p-GaN layer design.
原文 | ???core.languages.en_GB??? |
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文章編號 | 2300540 |
期刊 | Physica Status Solidi (A) Applications and Materials Science |
卷 | 221 |
發行號 | 13 |
DOIs | |
出版狀態 | 已出版 - 7月 2024 |