A programmable online/off-line built-in self-test scheme for RAMs with ECC

Keyphrases

• Random Access Memory 100%
• Built-in-self-test (BiST) 100%
• Error Correction Codes 100%
• Online to Offline 100%
• Embedded Memory 33%
• Transistor 16%
• Area Cost 16%
• Fault Location 16%
• Reliability Issues 16%
• System-on-chip Design 16%
• Online Test 16%
• Modern Systems 16%
• Memory Game 16%
• Aliasing Problem 16%
• Production Test 16%

Computer Science

• build-in self-test 100%
• Random Access Memory 100%
• Error Correction Code 100%
• embedded memory 33%
• Experimental Result 16%
• Fault Location 16%
• Aliasing 16%
• System-on-Chip 16%