@inproceedings{eb63bf615df04328af5e69df7114f2b7,
title = "A programmable online/off-line built-in self-test scheme for RAMs with ECC",
abstract = "Embedded memory plays an important role in modern system-on-chip designs. However, the reliability issue of embedded memories becomes more and more critical with the shrinking of transistor feature size. This paper proposes a programmable online/off-line built-in self-test (BIST) scheme for random access memories (RAMs) with error correction code (ECC). The BIST scheme can be used for performing production testing and periodic transparent testing. In comparison with an existing transparent BIST scheme, the proposed BIST scheme does not incur the aliasing problem. Also, it can provide good fault location capability in online test mode. Experimental results show that the area cost of the proposed online/off-line BIST scheme is low - only about 2.6% for a 4Kx39-bit SRAM.",
author = "Lu, {Hsing Chen} and Li, {Jin Fu}",
year = "2009",
doi = "10.1109/ISCAS.2009.5118183",
language = "???core.languages.en_GB???",
isbn = "9781424438280",
series = "Proceedings - IEEE International Symposium on Circuits and Systems",
pages = "1997--2000",
booktitle = "2009 IEEE International Symposium on Circuits and Systems, ISCAS 2009",
note = "2009 IEEE International Symposium on Circuits and Systems, ISCAS 2009 ; Conference date: 24-05-2009 Through 27-05-2009",
}