A novel complementary architecture of one-time-programmable memory and its applications as physical unclonable function (PUF) and one-time password

W. C. Wang, C. C. Chuang, C. W. Chang, E. R. Hsieh, H. W. Chen, Steve S. Chung

研究成果: 書貢獻/報告類型會議論文篇章同行評審

5 引文 斯高帕斯(Scopus)

摘要

For the first time, we proposed a 2T complementary architecture of one-time-programmable memory (OTP) in a foundry logic CMOS chip. It was then used to realize the PUF (Physical unclonable function), and the combination with the AI technology to provide a one-time password capability. At first, an OTP was developed based on a novel 2T CMOS unit cell. The experimental results show that the macro exhibits high speed operation, excellent data retention under more than 1 month baking at 200oC, and fairly large memory window. Next, a PUF is developed and because of the gate oxide integrity in the 40nm planar transistor technology, a superb randomness, i.e., an ideal and un-biased normal distribution of hamming distance, and narrow distribution of hamming weight can be achieved. Moreover, we use AI deep learning algorithms to generate a pseudo-PUF for one-time password successfully. Overall, this OTP provides an ideal and reliable solution either for the storage purpose or the security application in 5G era.

原文???core.languages.en_GB???
主出版物標題2020 IEEE International Electron Devices Meeting, IEDM 2020
發行者Institute of Electrical and Electronics Engineers Inc.
頁面31.6.1-31.6.4
ISBN(電子)9781728188881
DOIs
出版狀態已出版 - 12 12月 2020
事件66th Annual IEEE International Electron Devices Meeting, IEDM 2020 - Virtual, San Francisco, United States
持續時間: 12 12月 202018 12月 2020

出版系列

名字Technical Digest - International Electron Devices Meeting, IEDM
2020-December
ISSN(列印)0163-1918

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???event.eventtypes.event.conference???66th Annual IEEE International Electron Devices Meeting, IEDM 2020
國家/地區United States
城市Virtual, San Francisco
期間12/12/2018/12/20

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