A New Design of Ultra-Scaled and High-Density 1-nm Node 6T-SRAM Cell by Lateral-and-Complementary FETs (LC-FETs) with only 21 F2

Kai Wen Cheng, You Jin Liu, E. Ray Hsieh

研究成果: 書貢獻/報告類型會議論文篇章同行評審

摘要

In this paper, we design and evaluate a new 1-nm-node 6T SRAM cell, the Lateral-and-Complementary FET (LC-FETs) SRAM cell. This SRAM cell can dramatically decrease the layout area to only 23.34% of that of the N3 FinFET SRAM cell and show comparable performance of the N2 CFET SRAM cell, in terms of the RSNM and WNM values. To further improve the performance of the LC-FET SRAM cell, the pass-gates with more than one (2 or 3) LFETs are then proposed, which shows superior results to those of the N2 or N1 cells.

原文???core.languages.en_GB???
主出版物標題2024 International VLSI Symposium on Technology, Systems and Applications, VLSI TSA 2024 - Proceedings
發行者Institute of Electrical and Electronics Engineers Inc.
ISBN(電子)9798350360349
DOIs
出版狀態已出版 - 2024
事件2024 International VLSI Symposium on Technology, Systems and Applications, VLSI TSA 2024 - Hsinchu, Taiwan
持續時間: 22 4月 202425 4月 2024

出版系列

名字2024 International VLSI Symposium on Technology, Systems and Applications, VLSI TSA 2024 - Proceedings

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???event.eventtypes.event.conference???2024 International VLSI Symposium on Technology, Systems and Applications, VLSI TSA 2024
國家/地區Taiwan
城市Hsinchu
期間22/04/2425/04/24

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