A multilayer data copy test data compression scheme for reducing shifting-in power for multiple scan design

Shih Ping Lin, Chung Len Lee, Jwu E. Chen, Ji Jan Chen, Kun Lun Luo, Wen Ching Wu

研究成果: 雜誌貢獻期刊論文同行評審

28 引文 斯高帕斯(Scopus)

摘要

The random-like filling strategy pursuing high compression for today's popular test compression schemes introduces large test power. To achieve high compression in conjunction with reducing test power for multiple-scan-chain designs is even harder and very few works were dedicated to solve this problem. This paper proposes and demonstrates a multilayer data copy (MDC) scheme for test compression as well as test power reduction for multiple-scan-chain designs. The scheme utilizes a decoding buffer, which supports fast loading using previous loaded data, to achieve test data compression and test power reduction at the same time. The scheme can be applied automatic test pattern generation (ATPG)-independently or to be incorporated in an ATPG to generate highly compressible and power efficient test sets. Experiment results on benchmarks show that test sets generated by the scheme had large compression and power saving with only a small area design overhead.

原文???core.languages.en_GB???
頁(從 - 到)767-776
頁數10
期刊IEEE Transactions on Very Large Scale Integration (VLSI) Systems
15
發行號7
DOIs
出版狀態已出版 - 7月 2007

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