@inproceedings{77766777fa934e93ae867e7b920ac047,
title = "A high-resolution technique for flicker measurement in power quality monitoring",
abstract = "Flicker is one of significant power quality disturbances, which may lead to serious voltage fluctuation. Therefore, the accurate estimation of flicker components plays an important role in the power quality monitoring and protection of power system. In this paper, a high-resolution technique is proposed to extract the flicker components effectively. Different from the conventional spectral analysis methods, the performance of proposed mechanism would not be influenced by the fundamental frequency deviation, the sampling frequency, and the length of sampled data. With the experimental test, the estimation accuracy and robustness are verified.",
keywords = "flicker, flickermeter, fundamental frequency deviation, high-resolution technique, power quality",
author = "Chen, {Cheng I.} and Chen, {Yeong Chin} and Chen, {Chao Nan}",
year = "2013",
doi = "10.1109/ICIEA.2013.6566426",
language = "???core.languages.en_GB???",
isbn = "9781467363211",
series = "Proceedings of the 2013 IEEE 8th Conference on Industrial Electronics and Applications, ICIEA 2013",
pages = "528--533",
booktitle = "Proceedings of the 2013 IEEE 8th Conference on Industrial Electronics and Applications, ICIEA 2013",
note = "2013 IEEE 8th Conference on Industrial Electronics and Applications, ICIEA 2013 ; Conference date: 19-06-2013 Through 21-06-2013",
}