摘要
A technique to automatically derive and inject meaningful internal faults of C-modeled primitives using a high-level synthesis tool, called CONES, is presented. The realistic internal faults are derived from an optimized two-level implementation of the functional primitives synthesized by CONES. The concept of a parameterized C-model is developed to introduce fault effects for fault simulation. This technique has been verified using AT&T's in-house CAD tools. The experiments show fairly promising and interesting results.
原文 | ???core.languages.en_GB??? |
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頁面 | 287-289 |
頁數 | 3 |
出版狀態 | 已出版 - 1990 |
事件 | Proceedings of the 32nd Midwest Symposium on Circuits and Systems Part 2 (of 2) - Champaign, IL, USA 持續時間: 14 8月 1989 → 16 8月 1989 |
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???event.eventtypes.event.conference??? | Proceedings of the 32nd Midwest Symposium on Circuits and Systems Part 2 (of 2) |
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城市 | Champaign, IL, USA |
期間 | 14/08/89 → 16/08/89 |