A technique to automatically derive and inject meaningful internal faults of C-modeled primitives using a high-level synthesis tool, called CONES, is presented. The realistic internal faults are derived from an optimized two-level implementation of the functional primitives synthesized by CONES. The concept of a parameterized C-model is developed to introduce fault effects for fault simulation. This technique has been verified using AT&T's in-house CAD tools. The experiments show fairly promising and interesting results.
|出版狀態||已出版 - 1990|
|事件||Proceedings of the 32nd Midwest Symposium on Circuits and Systems Part 2 (of 2) - Champaign, IL, USA|
持續時間: 14 8月 1989 → 16 8月 1989
|???event.eventtypes.event.conference???||Proceedings of the 32nd Midwest Symposium on Circuits and Systems Part 2 (of 2)|
|城市||Champaign, IL, USA|
|期間||14/08/89 → 16/08/89|