A fast and sensitive built-in current sensor for IDDQ testing

Chih Wen Lu, Chung Len Lee, Jwu E. Chen

研究成果: 書貢獻/報告類型會議論文篇章同行評審

18 引文 斯高帕斯(Scopus)

摘要

In this work, a fast and highly sensitive Built-in Current (BIC) sensor is proposed for testing static CMOS ICs. The sensor employs a current mirror and an I-V converter to achieve the high sensing speed and high resolution. The circuit is simple and occupies a small area, making it ideal to be integrated into the IC chip for the IDDQ application.

原文???core.languages.en_GB???
主出版物標題Digest of Papers - 1996 IEEE International Workshop on IDDQ Testing, IDDQ 1996
編輯Carol Tong, Anura Jayasuniana
發行者Institute of Electrical and Electronics Engineers Inc.
頁面56-58
頁數3
ISBN(電子)0818676558, 9780818676550
DOIs
出版狀態已出版 - 1996
事件1996 IEEE International Workshop on IDDQ Testing, IDDQ 1996 - Washington, United States
持續時間: 24 10月 199625 10月 1996

出版系列

名字Digest of Papers - 1996 IEEE International Workshop on IDDQ Testing, IDDQ 1996

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???event.eventtypes.event.conference???1996 IEEE International Workshop on IDDQ Testing, IDDQ 1996
國家/地區United States
城市Washington
期間24/10/9625/10/96

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