@inproceedings{cea5ffab2bb94593af912f79eef88a42,
title = "A fast and sensitive built-in current sensor for IDDQ testing",
abstract = "In this work, a fast and highly sensitive Built-in Current (BIC) sensor is proposed for testing static CMOS ICs. The sensor employs a current mirror and an I-V converter to achieve the high sensing speed and high resolution. The circuit is simple and occupies a small area, making it ideal to be integrated into the IC chip for the IDDQ application.",
author = "Lu, {Chih Wen} and Lee, {Chung Len} and Chen, {Jwu E.}",
note = "Publisher Copyright: {\textcopyright} 1996 IEEE.; 1996 IEEE International Workshop on IDDQ Testing, IDDQ 1996 ; Conference date: 24-10-1996 Through 25-10-1996",
year = "1996",
doi = "10.1109/IDDQ.1996.557816",
language = "???core.languages.en_GB???",
series = "Digest of Papers - 1996 IEEE International Workshop on IDDQ Testing, IDDQ 1996",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "56--58",
editor = "Carol Tong and Anura Jayasuniana",
booktitle = "Digest of Papers - 1996 IEEE International Workshop on IDDQ Testing, IDDQ 1996",
}