A comprehensive transport model for high performance HEMTs considering the parasitic resistance and capacitance effects

C. M. Hung, K. C. Li, E. R. Hsieh, C. T. Wang, C. I. Kou, Edward Y. Chang, Steve S. Chung

研究成果: 書貢獻/報告類型會議論文篇章同行評審

指紋

深入研究「A comprehensive transport model for high performance HEMTs considering the parasitic resistance and capacitance effects」主題。共同形成了獨特的指紋。

Chemical Compounds

Engineering & Materials Science