A comparison of fault injection experiments under different verification environments

Kuen Long Leu, Yung Yuan Chen, Jwu E. Chen

研究成果: 書貢獻/報告類型會議論文篇章同行評審

4 引文 斯高帕斯(Scopus)

摘要

The main work of this paper is to characterize the dependability of fault-tolerant systems by using two different hardware design environments (SystemC and VHDL). For SystemC, we inject errors into the components' outputs, whereas faults into the inside of components for VHDL. The difference of the simulation results between SystemC and VHDL is discussed thoroughly through observing two parameters: one is the probability of a fault causing an effective error and another is the relationship between fault duration and error duration. The above two parameters dominate the discrepancy between the two different platforms. The experimental results show the effect of the parameters on the error coverage. This study can promote the fault-tolerant design and verification environment to a higher abstraction level.

原文???core.languages.en_GB???
主出版物標題Fourth International Conference on Information Technology and Applications, ICITA 2007
頁面582-587
頁數6
出版狀態已出版 - 2007
事件4th International Conference on Information Technology and Applications, ICITA 2007 - Harbin, China
持續時間: 15 1月 200718 1月 2007

出版系列

名字Fourth International Conference on Information Technology and Applications, ICITA 2007

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???event.eventtypes.event.conference???4th International Conference on Information Technology and Applications, ICITA 2007
國家/地區China
城市Harbin
期間15/01/0718/01/07

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