A carrier escape study from InAs self-assembled quantum dots by photocurrent measurement

W. H. Chang, T. M. Hsu, C. C. Huang, S. L. Hsu, C. Y. Lai, N. T. Yeh, J. I. Chyi

研究成果: 雜誌貢獻期刊論文同行評審

7 引文 斯高帕斯(Scopus)

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Physics & Astronomy

Chemical Compounds

Engineering & Materials Science