A BIST scheme with the ability of diagnostic data compression for RAMs

Chih Sheng Hou, Jin Fu Li, Ting Jun Fu

研究成果: 雜誌貢獻期刊論文同行評審

7 引文 斯高帕斯(Scopus)

摘要

This paper proposes a built-in self-test (BIST) scheme with syndrome-compression ability for random access memories (RAMs) with static (SF) and dynamic faults (DFs). A March-element-based (MEB) compression scheme is proposed to reduce the volume of diagnostic data. The MEB compression scheme can efficiently compress the diagnostic data of a RAM tested by a March test for detecting SFs and DFs. Simulation results show that the compression ratio (the ratio of the number bits of the compressed diagnostic data to that of the original diagnostic data) is about 50.79% for an 8K × 16-bit memory. The area overhead of the BIST with the MEB compressor is about 2.73% for an 8K × 16-bit RAM using TSMC 0.18 μm cell library.

原文???core.languages.en_GB???
文章編號6923433
頁(從 - 到)2020-2024
頁數5
期刊IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
33
發行號12
DOIs
出版狀態已出版 - 12月 2014

指紋

深入研究「A BIST scheme with the ability of diagnostic data compression for RAMs」主題。共同形成了獨特的指紋。

引用此