A bayesian zero-failure reliability demonstrationtest of highquality electro-explosive devices

Tsai Hung Fan, Chia Chen Chang

研究成果: 雜誌貢獻期刊論文同行評審

17 引文 斯高帕斯(Scopus)

摘要

Usually, for high reliability products the production cost is high and the lifetime is much longer, which may not be observable within a limited time. In this paper, an accelerated experiment is employed in which the lifetime follows an exponential distribution with the failure rate being related to the accelerated factor exponentially. The underlying parameters are also assumed to have the exponential prior distribu-tions. A Bayesian zero-failure reliability demonstration test is conducted to design forehand the minimum sample size and testing length subject to a certain specified reliability criterion. Probability of passing the test design as well as predictive prob-ability for additional experiments is also derived. Sensitivity analysis of the design is investigated by a simulation study.

原文???core.languages.en_GB???
頁(從 - 到)913-920
頁數8
期刊Quality and Reliability Engineering International
25
發行號8
DOIs
出版狀態已出版 - 12月 2009

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