A 30-36.6 GHz Low Jitter Degradation SIL QVCO with Frequency-tracking Loop in 65 nm CMOS for 5G Frontend Applications

Jhe Wei Li, Wei Cheng Chen, Jung Chou, Yu Cheng Liu, Hong Yeh Chang

研究成果: 書貢獻/報告類型會議論文篇章同行評審

摘要

In this paper, a low jitter degradation subharmonically injection-locked (SIL) quadrature voltage-controlled oscillator (QVCO) with frequency-tracking loop is presented using 65 nm CMOS process for 5G frontend applications. The QVCO is designed using a modified self-injection coupling technique to enhance the quadrature accuracy. An analog-based frequency-tracking loop is employed in the QVCO to adaptively align the control voltage. As the subharmonic number is 4, the locking frequency is from 30 to 36.6 GHz with a 19.6% fractional bandwidth. The phase noise at 1 MHz offset is-130.3 dBc/Hz, and the jitter integrated from 1 kHz to 40 MHz is 8.7 fs with a degradation of within 7 fs. When the temperature is between 20°C and 70°C, the variations of phase noise, jitter, output power are within 2.5 dB, 5 fs, and 1.5 dB, respectively. The quadrature errors are within 0.5 dB and 0.9°.

原文???core.languages.en_GB???
主出版物標題EuMIC 2020 - 2020 15th European Microwave Integrated Circuits Conference
發行者Institute of Electrical and Electronics Engineers Inc.
頁面241-244
頁數4
ISBN(電子)9782874870606
DOIs
出版狀態已出版 - 10 1月 2021
事件15th European Microwave Integrated Circuits Conference, EuMIC 2020 - Utrecht, Netherlands
持續時間: 11 1月 202112 1月 2021

出版系列

名字EuMIC 2020 - 2020 15th European Microwave Integrated Circuits Conference

???event.eventtypes.event.conference???

???event.eventtypes.event.conference???15th European Microwave Integrated Circuits Conference, EuMIC 2020
國家/地區Netherlands
城市Utrecht
期間11/01/2112/01/21

指紋

深入研究「A 30-36.6 GHz Low Jitter Degradation SIL QVCO with Frequency-tracking Loop in 65 nm CMOS for 5G Frontend Applications」主題。共同形成了獨特的指紋。

引用此