1-Transistor 1-Source/Channel/Drain-Diode (1T1D) One-Time-Programmable Memory in 14-nm FinFET

E. Ray Hsieh, Yu Ming Luo, Yi Xiang Huang, Huan Shiang Su, Rui Qi Lin, Yu Hsien Lin, Kai Hsiang Chang, Ting Ho Shen, Chuan Hsi Liu

研究成果: 雜誌貢獻期刊論文同行評審

2 引文 斯高帕斯(Scopus)


We present the 1-control-transistor and 1-source/channel/drain-diode(1T1D) one-time-programm- able (OTP) memory cells implemented in 14-nm complementary fin Field-effect-transistors (FinFETs). The OTP cells are fully integrable in the complementary-metal-oxide-semiconductor (CMOS) process without extra litho-masks. The feature size of a unit-cell is 14 F2 ( 0.0502μ2 ), which can be continually shrunk to 3-nm technology. The programming mechanism of the OTP is through the chain-effect induced by the impact-ionization between the channel-drain junction such that the junction structure is destructive, and the diode becomes blown, in terms of an effective open circuit. The pFinFET OTP can be programmed at -2.9 V; 3.1 V for the n-one. Moreover, programmed data can be retained in 200 °C for one month.

頁(從 - 到)404-407
期刊IEEE Electron Device Letters
出版狀態已出版 - 1 3月 2023


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