堆疊式記憶體測試與可靠度增強技術(3/3)

  • 1 會議論文篇章

搜尋結果

  • 2019

    Testing of in-memory-computing 8T SRAMs

    Tsai, T. L., Li, J. F., Hsu, C. L. & Sun, C. T., 10月 2019, 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019. Institute of Electrical and Electronics Engineers Inc., 8875487. (2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019).

    研究成果: 書貢獻/報告類型 › 會議論文篇章 › 同行評審

    23 引文 斯高帕斯（Scopus）