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堆疊式記憶體測試與可靠度增強技術(3/3)
Li, Jin-Fu
(PI)
電機工程學系
概覽
指紋
研究成果
(1)
指紋
探索此專案觸及的研究主題。這些標籤是根據基礎獎勵/補助款而產生。共同形成了獨特的指紋。
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Keyphrases
In-memory Computing
100%
Static Random Access Memory
100%
Stacked Memory
50%
Enhancement Techniques
50%
Reliability Enhancement
50%
Memory Array
36%
3D IC
33%
Reliability Techniques
25%
Design Reliability
16%
Error Correction Codes
16%
Computing Mode
14%
NAND Logic
14%
Memory Mode
14%
Memory Computing
14%
Functional Processes
14%
XOR Logic
14%
Data Transfer
14%
Testing Algorithm
14%
Logic Operation
14%
Functional Fault
14%
Memory Wall
14%
Von Neumann
14%
Computing Architecture
14%
Process Variation
14%
NOR Logic
14%
Test Complexity
14%
Device Reliability
8%
Design Technology
8%
Controller
8%
IC Design
8%
Circuit Reliability
8%
Through Silicon via
8%
Power Ground
8%
Built-in Self-repair
8%
Architectural Level
8%
Dynamic Error Correction
8%
Test Optimization
8%
Repair Method
8%
Built-in-self-test (BiST)
8%
Volume Production
8%
Processor Core
8%
Testability
8%
Effective Testing
8%
Reliability Analysis
8%
Ground Network
8%
Optimization Techniques
8%
Computer Science
Static Random Access Memory
100%
Memory Array
65%
Computer Architecture
60%
Error Correction Code
50%
Architecture Level
25%
through silicon vias
25%
Controller Level
25%
build-in self-test
25%
Processor Core
25%
Optimization Technique
25%
Technology Design
25%
Process Variation
20%
Test Algorithm
20%
Engineering
Correction Code
50%
Design for Reliability
50%
Error Correction
50%
Stack Memory
25%
Processor Core
25%
Integrated Circuit Design
25%
Reliability Analysis
25%
Memory Array
25%
Optimization Technique
25%
Production Volume
25%
Testability
25%
Built-in Self Test
25%
Test Technique
25%