跳至主導覽
跳至搜尋
跳過主要內容
國立中央大學 首頁
說明與常見問題
English
中文
首頁
人才檔案
研究單位
研究計畫
研究成果
資料集
榮譽/獲獎
學術活動
新聞/媒體
影響
按專業知識、姓名或所屬機構搜尋
具隨機效應及時間尺度之貝氏衰退試驗(2/2)
Fan, Tsai-Hung
(PI)
統計研究所
概覽
指紋
研究成果
(1)
指紋
探索此專案觸及的研究主題。這些標籤是根據基礎獎勵/補助款而產生。共同形成了獨特的指紋。
排序方式
重量
按字母排序
Keyphrases
Multivariate Weibull Distribution
100%
Reliability Data
100%
Risk Model
100%
Failure Mode
100%
Failure Time
66%
Random Effects
50%
Time Scaling
50%
Degradation Test
50%
Mean Time to Failure
33%
Reliability Systems
33%
Simulation Study
33%
Missing Information Principle
33%
Two-component
33%
Maximum Likelihood Estimation
33%
Weibull Distribution
33%
Expectation-maximization Algorithm
33%
Statistical Inference
33%
Series System
33%
Marshall-Olkin
33%
Masked Data
33%
Maximum Likelihood Method
33%
Degradation Analysis
14%
Degradation Data
14%
Degradation Model
14%
Mixture Prior
14%
Bayesian Approach
14%
Likelihood Function
7%
Stochastic Processes
7%
Product Basis
7%
Life Test
7%
Constant Stress
7%
Unified Approach
7%
Gamma Process
7%
Reliability Assessment
7%
Latent Variables
7%
Point Mass
7%
Step-stress
7%
Function Time
7%
Wiener Process
7%
Use Conditions
7%
First Year
7%
Model Combining
7%
Degradation Process
7%
Power Function
7%
Time-scaling Transformation
7%
Degradation Pathway
7%
Reliability Analysis
7%
Sequential Decay
7%
Quality Products
7%
Maximum Likelihood
7%
Accelerated Degradation Test
7%
Accelerated Testing
7%
Mathematics
Failure Mode
100%
Competing Risk Model
100%
Weibull Distribution
100%
Failure Time
66%
random time δ
50%
Bayesian
50%
Random Effect
50%
Quantile
33%
Maximum Likelihood Estimate
33%
Expectation-Maximization Algorithm
33%
Time Mean
33%
Maximum Likelihood
33%
Real Component
33%
Simulation Study
33%
Inferential Statistics
33%
Missing Information
33%
Likelihood Approach
33%
Series System
33%
Timescale
25%
Bayesian Approach
16%
Stochastic Process
8%
Experimental Time
8%
Reliability Assessment
8%
Power Function
8%
Posterior Sample
8%
Wiener Process
8%
Point Mass
8%
Life Test
8%
Likelihood Function
8%