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運算記憶體之測試與可靠性增強技術-總計畫暨子計畫一：運算記憶體之測試策略與自動化技術(3/3)
Li, Jin-Fu
(PI)
電機工程學系
概覽
指紋
研究成果
(3)
指紋
探索此專案觸及的研究主題。這些標籤是根據基礎獎勵/補助款而產生。共同形成了獨特的指紋。
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Keyphrases
Fault Aware
100%
Read Reliability
100%
Hardware Trojan
100%
Testing Algorithm
100%
Fault Test
100%
In-memory Computing
100%
In-memory
100%
Design for Testability
100%
Spin-transfer Torque Magnetic RAM (STT-MRAM)
100%
Memory Faults
100%
Test Design
100%
Error Correction Codes
71%
Security Design
40%
Computing Function
40%
Specific Sensing
20%
Test Development
20%
Memory Support
20%
Computing Mode
20%
Logic Operation
20%
Sensing Methods
20%
Memory Mode
20%
Wordline
20%
Development Method
20%
In-memory Computation
20%
Prevention Methods
20%
Fault Model
20%
Write Operation
20%
Memory Function
20%
Memory Design
20%
Non-volatile Memory
20%
Data Storage
20%
Modeling Development
20%
Detection Method
20%
March Test
20%
Embedded Memory
20%
Processor Design
20%
Volatile Memory
20%
Reading Failure
14%
Error Correction
14%
CMOS Technology
14%
Enhancement Techniques
14%
64-bit
14%
Failure Rate
14%
Read Disturb
14%
Area Cost
14%
Concurrent Error Detection
14%
40nm CMOS
14%
Scaling Challenges
14%
Reliability Enhancement
14%
Scrubbing
14%
Computer Science
Error Correction Code
100%
Test Algorithm
100%
Computer Hardware
100%
Random Access Memory
80%
Test Development
50%
Write Operation
50%
Wordline
50%
Current Processor
20%
Security Design
20%
Information Storage
20%
Volatile Memory
20%
embedded memory
20%
Non-Volatile Memory
20%
Memory Design
20%
Processor Design
20%
Error Correction
20%
Concurrent Error Detection
20%
Engineering
Error Correction
100%
Correction Code
83%
Spin Transfer
66%
Random Access Memory
66%
Concurrent Error Detection
16%
Failure Rate
16%
Bit Word
16%
Read Disturb
16%
Washing
16%