每年研究成果
每年研究成果
專案詳細資料
| 狀態 | 未開始 |
|---|---|
| 有效的開始/結束日期 | 1/08/25 → 31/07/26 |
指紋
探索此專案觸及的研究主題。這些標籤是根據基礎獎勵/補助款而產生。共同形成了獨特的指紋。
研究成果
- 3 會議論文篇章
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Fault-Aware ECC Scheme for Enhancing the Read Reliability of STT-MRAMs
Wu, M. S., Chua, Y. L., Li, J. F., Chuan, Y. T. & Huang, S. H., 2023, Proceedings - 7th IEEE International Test Conference in Asia, ITC-Asia 2023. Institute of Electrical and Electronics Engineers Inc., (Proceedings - 7th IEEE International Test Conference in Asia, ITC-Asia 2023).研究成果: 書貢獻/報告類型 › 會議論文篇章 › 同行評審
2 引文 斯高帕斯（Scopus） -
Hardware Trojans of Computing-In-Memories: Issues and Methods
Huang, S. H., Cheng, W. C. & Li, J. F., 2023, 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023. Cassano, L., Psarakis, M., Traiola, M. & Bosio, A. (編輯). Institute of Electrical and Electronics Engineers Inc., (Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT).研究成果: 書貢獻/報告類型 › 會議論文篇章 › 同行評審
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Testing of Computing-In Memories: Faults, Test Algorithms, and Design-for-Testability
Li, J. F., 2023, 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023. Cassano, L., Psarakis, M., Traiola, M. & Bosio, A. (編輯). Institute of Electrical and Electronics Engineers Inc., (Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT).研究成果: 書貢獻/報告類型 › 會議論文篇章 › 同行評審