Ying-Tsang Tang

查看斯高帕斯 (Scopus) 概要

電子郵件yttangee.ncu.edutw
網站https://scholars.ncu.edu.tw/zh/persons/ying-tsang-tang

h-index

每年研究成果

研究領域

半導體高介電材料,新興半導體材料計算,矽基量子電腦元件模擬

指紋

查看啟用 Ying-Tsang Tang 的研究主題。這些主題標籤來自此人的作品。共同形成了獨特的指紋。

1 類似的個人檔案

新進/年輕教師學術研究補助-唐英瓚
Tang, Y.-T. (PI)
1/01/22 → 31/12/22
研究計畫: Research
超低功耗節能電子元件與鐵電記憶體的相變科學及其應用於人工智慧之技術突破
Tang, Y.-T. (PI)
1/12/18 → 31/12/21
研究計畫: Research

27 會議論文篇章
11 期刊論文
1 評論/辯論

High-Fidelity and Noise-Resilient CNOT Gate Implementation Using Vertically Symmetric Fin-Based Architecture
Lai, W. Y., Yang, H. & Tang, Y. T., 2月 2026, 於: IEEE Electron Device Letters. 47, 2, p. 221-224 4 p.
研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
Enhanced Performance of P-FeFETs with TiN:2.5nm/Mo/TiN Gate Stacks for 3-bit-per-cell Operation, 3.5V Read-after-Write, and High Endurance (10⁹ Cycles) in Compute-in-Memory Applications
Tsai, C. Y., Hsiung, M. H., Chen, Y. C., Tsai, Y. T. & Tang, Y. T., 2025, 9th IEEE Electron Devices Technology and Manufacturing Conference: Shaping the Future with Innovations in Devices and Manufacturing, EDTM 2025. Institute of Electrical and Electronics Engineers Inc., (9th IEEE Electron Devices Technology and Manufacturing Conference: Shaping the Future with Innovations in Devices and Manufacturing, EDTM 2025).
研究成果: 書貢獻/報告類型 › 會議論文篇章 › 同行評審
Heterojunction Tunneling and Reverse Shockley-Read-Hall Recombination Effects in Si_1-xGe_x Channel/Si SDE CFETs for Steeper Subthreshold Swing and Low DIBL
Chang, P. L. & Tang, Y. T., 2025, 2025 Silicon Nanoelectronics Workshop, SNW 2025. Institute of Electrical and Electronics Engineers Inc., p. 114-115 2 p. (2025 Silicon Nanoelectronics Workshop, SNW 2025).
研究成果: 書貢獻/報告類型 › 會議論文篇章 › 同行評審
High-Storage, Low-Variability, and Low-Power Read-After-Write Superlattice HfO₂/ZrO₂ FeFET Memory Device by Using a Multifunctional MoO_x/TiON Layer
Chen, Z. K., Hsiung, M. H., Huang, Z. R., Wang, S. M., Liu, C. R., Chen, Y. T., Pai, C. S., Tasi, Y. T. & Tang, Y. T., 2025, 於: IEEE Transactions on Electron Devices. 72, 6, p. 2930-2935 6 p.
研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
2 引文斯高帕斯（Scopus）
Reliability Analysis of CFETs Under Various NBTI Conditions
Kung, H. T., Thoti, N., Komsa, H. P. & Tang, Y. T., 2025, 2025 Silicon Nanoelectronics Workshop, SNW 2025. Institute of Electrical and Electronics Engineers Inc., p. 70-71 2 p. (2025 Silicon Nanoelectronics Workshop, SNW 2025).
研究成果: 書貢獻/報告類型 › 會議論文篇章 › 同行評審
1 引文斯高帕斯（Scopus）

Supplement
Liu, C.-R. (???dataset.roles.dataset.creator???), Tsai, Y.-T. (???dataset.roles.dataset.creator???), Chen, Y.-T. (???dataset.roles.dataset.creator???), Chen, Z.-K. (???dataset.roles.dataset.creator???), Huang, Z.-R. (???dataset.roles.dataset.creator???), Wang, S.-M. (???dataset.roles.dataset.creator???), Pai, C.-S. (???dataset.roles.dataset.creator???) & Tang, Y. (???dataset.roles.dataset.creator???), AIP Publishing, 2024
DOI: 10.60893/figshare.jap.26412742.v1, https://aip.figshare.com/articles/figure/Supplement/26412742/1
資料集
Supplement
Liu, C.-R. (???dataset.roles.dataset.creator???), Tsai, Y.-T. (???dataset.roles.dataset.creator???), Chen, Y.-T. (???dataset.roles.dataset.creator???), Chen, Z.-K. (???dataset.roles.dataset.creator???), Huang, Z.-R. (???dataset.roles.dataset.creator???), Wang, S.-M. (???dataset.roles.dataset.creator???), Pai, C.-S. (???dataset.roles.dataset.creator???) & Tang, Y. (???dataset.roles.dataset.creator???), AIP Publishing, 2024
DOI: 10.60893/figshare.jap.26412742, https://aip.figshare.com/articles/figure/Supplement/26412742
資料集

唐英瓚

個人檔案

研究領域

指紋

過去五年中的合作和熱門研究領域

深入探索詳細資料

新進/年輕教師學術研究補助-唐英瓚

超低功耗節能電子元件與鐵電記憶體的相變科學及其應用於人工智慧之技術突破

High-Fidelity and Noise-Resilient CNOT Gate Implementation Using Vertically Symmetric Fin-Based Architecture

Enhanced Performance of P-FeFETs with TiN:2.5nm/Mo/TiN Gate Stacks for 3-bit-per-cell Operation, 3.5V Read-after-Write, and High Endurance (10⁹ Cycles) in Compute-in-Memory Applications

Heterojunction Tunneling and Reverse Shockley-Read-Hall Recombination Effects in Si_1-xGe_x Channel/Si SDE CFETs for Steeper Subthreshold Swing and Low DIBL

High-Storage, Low-Variability, and Low-Power Read-After-Write Superlattice HfO₂/ZrO₂ FeFET Memory Device by Using a Multifunctional MoO_x/TiON Layer

Reliability Analysis of CFETs Under Various NBTI Conditions

Supplement

Supplement

唐 英瓚

個人檔案

研究領域

指紋

過去五年中的合作和熱門研究領域

專案

研究成果

資料集

唐英瓚