搜尋結果
2011
Lee, S. W. ,
Chang, H. T. ,
Chang, J. K. &
Cheng, S. L. ,
2011 ,
於: Journal of the Electrochemical Society. 158 ,
11 ,
p. H1113-H1116 研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
Composite materials
100%
Composite Material
85%
Blue shift
47%
Etching
44%
High resolution transmission electron microscopy
40%
2010
Lee, S. W. ,
Chang, H. T. ,
Lee, C. H. ,
Cheng, S. L. &
Liu, C. W. ,
1 1月 2010 ,
於: Thin Solid Films. 518 ,
6 SUPPL. 1 ,
p. S196-S199 研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
Annealing
100%
Chemical analysis
65%
annealing
60%
Surface Diffusion
41%
Surface diffusion
38%
Lee, S. W. ,
Huang, S. S. ,
Hsu, H. C. ,
Nieh, C. W. ,
Tsai, W. C. ,
Lo, C. P. ,
Lai, C. H. ,
Tsai, P. Y. ,
Wang, M. Y. ,
Wu, C. M. &
Lei, M. D. ,
2010 ,
於: Journal of the Electrochemical Society. 157 ,
3 ,
p. H297-H300 研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
Epitaxial films
100%
Epitaxial Film
93%
Silicides
89%
Atoms
68%
Diffusion Barrier
41%
Wu, W. W. ,
Wang, C. W. ,
Chen, K. N. ,
Cheng, S. L. &
Lee, S. W. ,
1 10月 2010 ,
於: Thin Solid Films. 518 ,
24 ,
p. 7279-7282 4 p. 研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
Silicides
100%
silicides
75%
Titanium
70%
interlayers
66%
titanium
60%
Etching
100%
Fabrication
68%
Field emission
39%
Electrons
31%
Field Emission
30%
Lee, C. H. ,
Liu, C. W. ,
Chang, H. T. &
Lee, S. W. ,
2010 ,
於: Journal of Applied Physics. 107 ,
5 , 056103.
研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
quantum dots
100%
rings
59%
annealing
51%
caps
45%
Raman spectroscopy
36%
electrochemical synthesis
100%
Nanorods
94%
nanorods
62%
Nanorod
54%
Silicon
50%
Lee, S. W. ,
Huang, S. H. ,
Cheng, S. L. ,
Chen, P. S. &
Wu, W. W. ,
1 10月 2010 ,
於: Thin Solid Films. 518 ,
24 ,
p. 7394-7397 4 p. 研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
Epilayers
100%
Silicides
80%
silicides
60%
thermal stability
51%
Growth kinetics
42%
Chang, H. T. ,
Chen, W. Y. ,
Hsu, T. M. ,
Shushpannikov, P. S. ,
Goldstein, R. V. &
Lee, S. W. ,
2010 ,
於: Electrochemical and Solid-State Letters. 13 ,
5 ,
p. K43-K45 研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
Nanodots
100%
Strain relaxation
92%
Etching
49%
Lenticular Crystal
45%
Photoluminescence
44%
2009
Strain relaxation
100%
Buffer layers
84%
Heterojunctions
77%
Boron
67%
Hydrogen
47%
Hu, C. W. ,
Chang, T. C. ,
Tu, C. H. ,
Chiang, C. N. ,
Lin, C. C. ,
Lee, S. W. ,
Chang, C. Y. ,
Sze, S. M. &
Tseng, T. Y. ,
2009 ,
於: Journal of the Electrochemical Society. 156 ,
9 ,
p. H751-H755 研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
Nanocrystals
100%
Nanocrystal
54%
Data storage equipment
40%
Quantum confinement
20%
Raman spectroscopy
14%
Lee, S. W. ,
Lee, C. H. ,
Chang, H. T. ,
Cheng, S. L. &
Liu, C. W. ,
1 7月 2009 ,
於: Thin Solid Films. 517 ,
17 ,
p. 5029-5032 4 p. 研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
Nanorings
100%
Nanoring
70%
Wet etching
34%
Chemical analysis
32%
Atomic force microscopy
31%
Cheng, S. L. ,
Chen, Y. Y. ,
Lee, S. W. &
Hsu, H. F. ,
1 7月 2009 ,
於: Thin Solid Films. 517 ,
17 ,
p. 4745-4748 4 p. 研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
Marker
100%
markers
82%
Alloy
79%
kinetics
67%
Solid state reactions
58%
Lee, C. H. ,
Shen, Y. Y. ,
Liu, C. W. ,
Lee, S. W. ,
Lin, B. H. &
Hsu, C. H. ,
2009 ,
於: Applied Physics Letters. 94 ,
14 , 141909.
研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
ultrahigh vacuum
100%
vapor deposition
76%
caps
70%
quantum dots
51%
x ray diffraction
28%
2008
Silicides
100%
Cobalt
84%
silicides
75%
Thin films
69%
cobalt
68%
Chen, P. S. ,
Lee, S. W. ,
Lee, M. H. &
Liu, C. W. ,
30 7月 2008 ,
於: Applied Surface Science. 254 ,
19 ,
p. 6076-6080 5 p. 研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
Buffer layers
100%
Strain relaxation
79%
Multilayers
67%
buffers
59%
Multilayer
46%
Lee, S. W. ,
Chen, P. S. ,
Cheng, S. L. ,
Lee, M. H. ,
Chang, H. T. ,
Lee, C. H. &
Liu, C. W. ,
30 7月 2008 ,
於: Applied Surface Science. 254 ,
19 ,
p. 6261-6264 4 p. 研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
Ultrahigh vacuum
100%
mediation
85%
Chemical vapor deposition
74%
ultrahigh vacuum
63%
Chemical Vapour Deposition
57%
Lee, M. H. ,
Chang, S. T. ,
Lee, S. W. ,
Chen, P. S. ,
Shen, K. W. &
Wang, W. C. ,
30 7月 2008 ,
於: Applied Surface Science. 254 ,
19 ,
p. 6147-6150 4 p. 研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
field effect transistors
100%
Carbon
96%
engineering
94%
carbon
84%
Carbon Atom
59%
2007
Multilayers
100%
Multilayer
91%
Lenticular Crystal
57%
Photoluminescence
55%
Infrared spectrometers
51%
2006
Lee, S. W. ,
Chueh, Y. L. ,
Chen, H. C. ,
Chen, L. J. ,
Chen, P. S. ,
Chou, L. J. &
Liu, C. W. ,
5 6月 2006 ,
於: Thin Solid Films. 508 ,
1-2 ,
p. 218-221 4 p. 研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
Field emission
100%
Field Emission
78%
field emission
70%
Quantum Dot
69%
Pyramidal Crystal
66%
Relaxation
100%
field effect transistors
84%
Threading Dislocation
67%
Misfit Dislocation
65%
Dislocations (crystals)
56%
Chen, P. S. ,
Lee, S. W. ,
Lee, M. H. &
Liu, C. W. ,
1 4月 2006 ,
於: Semiconductor Science and Technology. 21 ,
4 ,
p. 479-485 7 p. 研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
Threading Dislocation
100%
Relaxation
66%
Dislocation Loop
65%
field effect transistors
55%
Buffer Solution
46%
Lee, S. W. ,
Chen, P. S. ,
Chien, T. Y. ,
Chen, L. J. ,
Chia, C. T. &
Liu, C. W. ,
5 6月 2006 ,
於: Thin Solid Films. 508 ,
1-2 ,
p. 120-123 4 p. 研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
Buffer layers
100%
Threading Dislocation
87%
Quantum Dot
62%
buffers
59%
quantum dots
54%
Chen, H. C. ,
Wang, C. W. ,
Lee, S. W. &
Chen, L. J. ,
3 2月 2006 ,
於: Advanced Materials. 18 ,
3 ,
p. 367-370 4 p. 研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
Photoluminescence
100%
Superlattice
63%
Quantum Dot
54%
Quantum confinement
37%
Nanodots
37%
2005
Lee, S. W. ,
Chueh, Y. L. ,
Chen, L. J. ,
Chou, L. J. ,
Chen, P. S. ,
Tsai, M. J. &
Liu, C. W. ,
1 10月 2005 ,
於: Journal of Applied Physics. 98 ,
7 , 073506.
研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
ultrahigh vacuum
100%
field emission
90%
quantum dots
77%
vapor deposition
76%
mediation
67%
Lee, S. W. ,
Chueh, Y. L. ,
Chen, L. J. ,
Chou, L. J. ,
Chen, P. S. ,
Lee, M. H. ,
Tsai, M. J. &
Liu, C. W. ,
7月 2005 ,
於: Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films. 23 ,
4 ,
p. 1141-1145 5 p. 研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
Buffer layers
100%
Threading Dislocation
98%
Misfit Dislocation
97%
Substrates
74%
Buffer Solution
68%
He, J. H. ,
Wu, W. W. ,
Lee, S. W. ,
Chen, L. J. ,
Chueh, Y. L. &
Chou, L. J. ,
27 6月 2005 ,
於: Applied Physics Letters. 86 ,
26 ,
p. 1-3 3 p. , 263109.
研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
nanowires
100%
synthesis
89%
oxides
77%
light emission
28%
field emission
28%
Chen, P. S. ,
Lee, S. W. ,
Liu, Y. H. ,
Lee, M. H. ,
Tsai, M. J. &
Liu, C. W. ,
2月 2005 ,
於: Materials Science in Semiconductor Processing. 8 ,
1-3 SPEC. ISS. ,
p. 15-19 5 p. 研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
Ultrahigh vacuum
100%
Chemical vapor deposition
74%
Secondary Ion Mass Spectroscopy
69%
Ethylene
66%
ultrahigh vacuum
63%
2004
Chen, P. S. ,
Pei, Z. ,
Peng, Y. H. ,
Lee, S. W. &
Tsai, M. J. ,
15 5月 2004 ,
於: Materials Science and Engineering B: Solid-State Materials for Advanced Technology. 108 ,
3 ,
p. 213-218 6 p. 研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
Growth temperature
100%
Ultrahigh vacuum
97%
mediation
83%
Chemical vapor deposition
72%
Boron
70%
Lee, S. W. ,
Chen, L. J. ,
Chen, P. S. ,
Tsai, M. J. ,
Liu, C. W. ,
Chen, W. Y. &
Hsu, T. M. ,
15 3月 2004 ,
於: Applied Surface Science. 224 ,
1-4 ,
p. 152-155 4 p. 研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
pretreatment
100%
Cones
85%
Quantum Dot
81%
Strain relaxation
77%
Photoluminescence
73%
Chen, P. S. ,
Lee, S. W. ,
Peng, Y. H. ,
Liu, C. W. &
Tsai, M. J. ,
12月 2004 ,
於: Physica Status Solidi (B) Basic Research. 241 ,
15 ,
p. 3650-3655 6 p. 研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
Photoluminescence
100%
spacers
64%
Photoemission
55%
Quantum Dot
54%
Ultrahigh vacuum
48%
Pei, Z. ,
Chen, P. S. ,
Lee, S. W. ,
Lai, L. S. ,
Lu, S. C. ,
Tsai, M. J. ,
Chang, W. H. ,
Chen, W. Y. ,
Chou, A. T. &
Hsu, T. M. ,
15 3月 2004 ,
於: Applied Surface Science. 224 ,
1-4 ,
p. 165-169 5 p. 研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
Electroluminescence
100%
Leakage Current
83%
Emission Peak
67%
electroluminescence
64%
Multilayer
56%
Chen, H. C. ,
Liao, K. F. ,
Lee, S. W. &
Chen, L. J. ,
22 12月 2004 ,
於: Thin Solid Films. 469-470 ,
SPEC. ISS. ,
p. 483-486 4 p. 研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
Epitaxial growth
100%
Silicides
97%
Epitaxial Growth
86%
silicides
73%
Semiconductor materials
63%
He, J. H. ,
Chueh, Y. L. ,
Wu, W. W. ,
Lee, S. W. ,
Chen, L. J. &
Chou, L. J. ,
22 12月 2004 ,
於: Thin Solid Films. 469-470 ,
SPEC. ISS. ,
p. 478-482 5 p. 研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
Gold nanoparticles
100%
Thin films
59%
Silicon
49%
rings
43%
silicon
34%
2003
Chiang, T. F. ,
Wu, W. W. ,
Cheng, S. L. ,
Lin, H. H. ,
Lee, S. W. &
Chen, L. J. ,
15 5月 2003 ,
於: Applied Surface Science. 212-213 ,
SPEC. ,
p. 339-343 5 p. 研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
Nanocrystallites
100%
Autocorrelation Function
79%
Crystallization
59%
Autocorrelation
57%
Annealing
54%
Wu, W. W. ,
Cheng, S. L. ,
Lee, S. W. &
Chen, L. J. ,
9月 2003 ,
於: Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 21 ,
5 ,
p. 2147-2150 4 p. 研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
interlayers
100%
Growth temperature
88%
Molecular beam epitaxy
84%
electrical resistivity
69%
thickness ratio
67%
Chang, W. H. ,
Chou, A. T. ,
Chen, W. Y. ,
Chang, H. S. ,
Hsu, T. M. ,
Pei, Z. ,
Chen, P. S. ,
Lee, S. W. ,
Lai, L. S. ,
Lu, S. C. &
Tsai, M. J. ,
6 10月 2003 ,
於: Applied Physics Letters. 83 ,
14 ,
p. 2958-2960 3 p. 研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
electroluminescence
100%
quantum dots
76%
room temperature
55%
passivity
45%
light emitting diodes
39%
Lee, S. W. ,
Chen, L. J. ,
Chen, P. S. ,
Tsai, M. J. ,
Liu, C. W. ,
Chien, T. Y. &
Chia, C. T. ,
22 12月 2003 ,
於: Applied Physics Letters. 83 ,
25 ,
p. 5283-5285 3 p. 研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
pyramids
100%
quantum dots
68%
microstructure
51%
Wu, W. W. ,
He, J. H. ,
Cheng, S. L. ,
Lee, S. W. &
Chen, L. J. ,
1 9月 2003 ,
於: Applied Physics Letters. 83 ,
9 ,
p. 1836-1838 3 p. 研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
quantum dots
100%
silicides
67%
templates
60%
periodic variations
59%
2002
Lee, S. W. ,
Chen, H. C. ,
Chen, L. J. ,
Peng, Y. H. ,
Kuan, C. H. &
Cheng, H. H. ,
1 12月 2002 ,
於: Journal of Applied Physics. 92 ,
11 ,
p. 6880-6885 6 p. 研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
molecular beam epitaxy
100%
buffers
99%
silicon
63%
thick films
27%
surface roughness
24%
Wu, W. W. ,
Chiang, T. F. ,
Cheng, S. L. ,
Lee, S. W. ,
Chen, L. J. ,
Peng, Y. H. &
Cheng, H. H. ,
29 7月 2002 ,
於: Applied Physics Letters. 81 ,
5 ,
p. 820-822 3 p. 研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
interlayers
100%
flatness
40%
molecular beams
37%
high speed
27%
fabrication
22%
Hsu, B. C. ,
Chen, K. F. ,
Lai, C. C. ,
Lee, S. W. &
Liu, C. W. ,
12月 2002 ,
於: IEEE Transactions on Electron Devices. 49 ,
12 ,
p. 2204-2208 5 p. 研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
Tunneling Current
100%
Diodes
59%
Oxides
55%
Surface roughness
53%
Current density
37%