鄭 國興

Engineering & Materials Science

1. Clocks 100%
2. Jitter 88%
3. Phase locked loops 68%
4. Networks (circuits) 63%
5. Electric potential 62%
6. Electric power utilization 35%
7. Mirrors 28%
8. Variable frequency oscillators 25%
9. Transistors 21%
10. Energy dissipation 20%
11. Calibration 19%
12. Adders 19%
13. Logic circuits 15%
14. Frequency multiplying circuits 15%
15. Data storage equipment 13%
16. Electric delay lines 12%
17. System-on-chip 11%
18. Detectors 11%
19. Pumps 10%
20. Logic Synthesis 9%
21. Feedback 9%
22. RRAM 9%
23. Threshold voltage 8%
24. Voltage control 8%
25. Charge transfer 8%
26. Tuning 8%
27. Charge pump circuits 7%
28. Equalizers 7%
29. Flip flop circuits 7%
30. Leaching 7%
31. Recovery 6%
32. Operational amplifiers 6%
33. Phase noise 6%
34. BiCMOS technology 6%
35. Time delay 6%
36. Sampling 6%
37. Synchronization 5%
38. Built-in self test 5%
39. Delay lock loops 5%
40. Delay circuits 5%
41. Photovoltaic cells 5%
42. Bandwidth 5%
43. Capacitors 5%