Jin-Fu Li

2021

Testing of in-memory-computing memories with 8 T SRAMs

Tsai, T. L., Li, J. F., Hsu, C. L. & Sun, C. T., 8月 2021, 於: Microelectronics Reliability. 123, 114215.

研究成果: 雜誌貢獻 › 期刊論文 › 同行評審

3 引文斯高帕斯（Scopus）

2020

Energy-Efficient Monolithic 3-D SRAM Cell with BEOL MoS₂FETs for SoC Scaling

Hu, V. P. H., Su, C. W., Lee, Y. W., Ho, T. Y., Cheng, C. C., Chen, T. C., Hung, T. Y. T., Li, J. F., Chen, Y. G. & Li, L. J., 10月 2020, 於: IEEE Transactions on Electron Devices. 67, 10, p. 4216-4221 6 p., 9184285.

研究成果: 雜誌貢獻 › 期刊論文 › 同行評審

7 引文斯高帕斯（Scopus）

2018

Conference Reports: Report on 2017 IEEE Asian Test Symposium

Li, J. F. & Huang, J. L., 4月 2018, 於: IEEE Design and Test. 35, 2, p. 103-104 2 p.

研究成果: 雜誌貢獻 › 期刊論文 › 同行評審

2015

High repair-efficiency BISR scheme for RAMs by reusing bitmap for bit redundancy

Hou, C. S. & Li, J. F., 1 9月 2015, 於: IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 23, 9, p. 1720-1728 9 p., 6898029.

研究成果: 雜誌貢獻 › 期刊論文 › 同行評審

13 引文斯高帕斯（Scopus）

2014

A BIST scheme with the ability of diagnostic data compression for RAMs

Hou, C. S., Li, J. F. & Fu, T. J., 12月 2014, 於: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 33, 12, p. 2020-2024 5 p., 6923433.

研究成果: 雜誌貢獻 › 期刊論文 › 同行評審

5 引文斯高帕斯（Scopus）

Testing Disturbance Faults in Various NAND Flash Memories

Hou, C. S. & Li, J. F., 3 12月 2014, 於: Journal of Electronic Testing: Theory and Applications (JETTA). 30, 6, p. 643-652 10 p.

研究成果: 雜誌貢獻 › 期刊論文 › 同行評審

1 引文斯高帕斯（Scopus）

Yield-enhancement schemes for multicore processor and memory stacked 3D ICs

Huang, Y. J. & Li, J. F., 3月 2014, 於: ACM Transactions on Embedded Computing Systems. 13, 3s, 106.

研究成果: 雜誌貢獻 › 期刊論文 › 同行評審

1 引文斯高帕斯（Scopus）

2013

A built-in self-repair scheme for 3-D RAMs with interdie redundancy

Chou, C. W., Huang, Y. J. & Li, J. F., 2013, 於: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 32, 4, p. 572-583 12 p., 6480861.

研究成果: 雜誌貢獻 › 期刊論文 › 同行評審

11 引文斯高帕斯（Scopus）

A self-repair technique for content addressable memories with address-input-free writing function

Lai, C. K., Huang, Y. J. & Li, J. F., 5月 2013, 於: Journal of Information Science and Engineering. 29, 3, p. 493-507 15 p.

研究成果: 雜誌貢獻 › 期刊論文 › 同行評審

2012

A low-power ternary content addressable memory with Pai-Sigma matchlines

Yang, S. H., Huang, Y. J. & Li, J. F., 2012, 於: IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 20, 10, p. 1909-1913 5 p., 5993479.

研究成果: 雜誌貢獻 › 期刊論文 › 同行評審

27 引文斯高帕斯（Scopus）

Built-in self-repair scheme for the TSVs in 3-D ICs

Huang, Y. J. & Li, J. F., 2012, 於: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 31, 10, p. 1600-1613 14 p., 6303937.

研究成果: 雜誌貢獻 › 期刊論文 › 同行評審

33 引文斯高帕斯（Scopus）

Cost-efficient built-In redundancy analysis with optimal repair rate for RAMs

Chen, T. J., Li, J. F. & Tseng, T. W., 2012, 於: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 31, 6, p. 930-940 11 p., 6200438.

研究成果: 雜誌貢獻 › 期刊論文 › 同行評審

16 引文斯高帕斯（Scopus）

Low-cost self-test techniques for small RAMs in SOCs using enhanced IEEE 1500 test wrappers

Huang, Y. J. & Li, J. F., 2012, 於: IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 20, 11, p. 2123-2127 5 p., 6035755.

研究成果: 雜誌貢獻 › 期刊論文 › 同行評審

Testing and diagnosing comparison faults of TCAMs with asymmetric cells

Li, J. F., 2012, 於: IEEE Transactions on Computers. 61, 11, p. 1576-1587 12 p., 6035686.

研究成果: 雜誌貢獻 › 期刊論文 › 同行評審

2 引文斯高帕斯（Scopus）

2011

A low-cost built-in redundancy-analysis scheme for word-oriented RAMs with 2-D redundancy

Tseng, T. W. & Li, J. F., 11月 2011, 於: IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 19, 11, p. 1983-1995 13 p., 5565531.

研究成果: 雜誌貢獻 › 期刊論文 › 同行評審

9 引文斯高帕斯（Scopus）

Memory built-in self-repair planning framework for RAMs in SoCs

Hou, C. S., Li, J. F. & Tseng, T. W., 11月 2011, 於: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 30, 11, p. 1731-1743 13 p., 6046177.

研究成果: 雜誌貢獻 › 期刊論文 › 同行評審

9 引文斯高帕斯（Scopus）

SETBIST: An soft-error tolerant built-in self-test scheme for random access memories

Tseng, T. W. & Li, J. F. U., 3月 2011, 於: Journal of Information Science and Engineering. 27, 2, p. 643-656 14 p.

研究成果: 雜誌貢獻 › 期刊論文 › 同行評審

2010

A Built-in Method to Repair SoC RAMs in Parallel

Tseng, T. W., Li, J. F. & Hou, C. S., 11月 2010, 於: IEEE Design and Test of Computers. 27, 6, p. 46-57 12 p., 5648494.

研究成果: 雜誌貢獻 › 期刊論文 › 同行評審

12 引文斯高帕斯（Scopus）

DABISR: A defect-aware built-in self-repair scheme for single/multi-port RAMs in SoCs

Tseng, T. W., Huang, Y. J. & Li, J. F., 10月 2010, 於: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 29, 10, p. 1628-1639 12 p., 5580226.

研究成果: 雜誌貢獻 › 期刊論文 › 同行評審

9 引文斯高帕斯（Scopus）

ReBISR: A reconfigurable built-in self-repair scheme for random access memories in SOCs

Tseng, T. W., Li, J. F. & Hsu, C. C., 6月 2010, 於: IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 18, 6, p. 921-932 12 p., 5299100.

研究成果: 雜誌貢獻 › 期刊論文 › 同行評審

45 引文斯高帕斯（Scopus）

Reliability-enhancement and self-repair schemes for SRAMs with static and dynamic faults

Li, J. F., Tseng, T. W. & Hou, C. S., 9月 2010, 於: IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 18, 9, p. 1361-1366 6 p., 5210133.

研究成果: 雜誌貢獻 › 期刊論文 › 同行評審

10 引文斯高帕斯（Scopus）

Testing comparison and delay faults of TCAMs with asymmetric cells

Li, J. F., 6月 2010, 於: IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 18, 6, p. 912-920 9 p., 5299103.

研究成果: 雜誌貢獻 › 期刊論文 › 同行評審

10 引文斯高帕斯（Scopus）

Testing random defect and process variation induced comparison faults of TCAMs with asymmetric cells

Li, J. F., Huang, Y. J. & Hu, Y. J., 11月 2010, 於: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 29, 11, p. 1843-1847 5 p., 5605326.

研究成果: 雜誌貢獻 › 期刊論文 › 同行評審

3 引文斯高帕斯（Scopus）

2009

Memory built-in self test in multicore chips with mesh-based networks

Liu, H. N., Huang, Y. J. & Li, J. F., 9月 2009, 於: IEEE Micro. 29, 5, p. 46-55 10 p., 5325155.

研究成果: 雜誌貢獻 › 期刊論文 › 同行評審

6 引文斯高帕斯（Scopus）

2008

A built-in redundancy-analysis scheme for random access memories with two-level redundancy

Chang, D. M., Li, J. F. & Huang, Y. J., 6月 2008, 於: Journal of Electronic Testing: Theory and Applications (JETTA). 24, 1-3, p. 181-192 12 p.

研究成果: 雜誌貢獻 › 期刊論文 › 同行評審

15 引文斯高帕斯（Scopus）

A multi-code compression scheme for test time reduction of system-on-chip designs

Shieh, H. M. & Li, J. F., 10月 2008, 於: IEICE Transactions on Information and Systems. E91-D, 10, p. 2428-2434 7 p.

研究成果: 雜誌貢獻 › 期刊論文 › 同行評審

開啟存取

2007

An efficient diagnosis scheme for RAMs with simple functional faults

Li, J. F. & Huang, C. D., 12月 2007, 於: IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences. E90-A, 12, p. 2703-2711 9 p.

研究成果: 雜誌貢獻 › 期刊論文 › 同行評審

ProTaR: An infrastructure IP for repairing RAMs in system-on-chips

Huang, C. D., Li, J. F. & Tseng, T. W., 10月 2007, 於: IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 15, 10, p. 1135-1143 9 p.

研究成果: 雜誌貢獻 › 期刊論文 › 同行評審

38 引文斯高帕斯（Scopus）

Raisin: Redundancy analysis algorithm simulation

Huang, R. F., Li, J. F., Yeh, J. C. & Wu, C. W., 2007, 於: IEEE Design and Test of Computers. 24, 4, p. 386-396 11 p.

研究成果: 雜誌貢獻 › 期刊論文 › 同行評審

28 引文斯高帕斯（Scopus）

Testing ternary content addressable memories with active neighbourhood pattern-sensitive faults

Huang, Y. J. & Li, J. F., 2007, 於: IET Computers and Digital Techniques. 1, 3, p. 246-255 10 p.

研究成果: 雜誌貢獻 › 期刊論文 › 同行評審

8 引文斯高帕斯（Scopus）

Testing ternary content addressable memories with comparison faults using march-like tests

Li, J. F., 5月 2007, 於: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 26, 5, p. 919-931 13 p.

研究成果: 雜誌貢獻 › 期刊論文 › 同行評審

14 引文斯高帕斯（Scopus）

Testing ternary content addressable memories with comparison faults using march-like tests

Li, J. F., 5月 2007, 於: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 26, 5, p. 919-931 13 p., 8361585.

研究成果: 雜誌貢獻 › 期刊論文 › 同行評審

Transparent-test methodologies for random access memories without/with ECC

Li, J. F., 10月 2007, 於: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 26, 10, p. 1888-1893 6 p.

研究成果: 雜誌貢獻 › 期刊論文 › 同行評審

8 引文斯高帕斯（Scopus）

2005

A built-in self-repair design for RAMs with 2-D redundancy

Li, J. F., Yeh, J. C., Huang, R. F. & Wu, C. W., 6月 2005, 於: IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 13, 6, p. 742-745 4 p.

研究成果: 雜誌貢獻 › 期刊論文 › 同行評審

65 引文斯高帕斯（Scopus）

2004

Diagnosing Binary Content Addressable Memories with Comparison and RAM Faults

Li, J. F., 3月 2004, 於: IEICE Transactions on Information and Systems. E87-D, 3, p. 601-608 8 p.

研究成果: 雜誌貢獻 › 期刊論文 › 同行評審

5 引文斯高帕斯（Scopus）

Efficient block-level connectivity verification algorithms for embedded memories

Li, J. F., 12月 2004, 於: IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences. E87-A, 12, p. 3185-3192 8 p.

研究成果: 雜誌貢獻 › 期刊論文 › 同行評審

1 引文斯高帕斯（Scopus）

2003

Built-In Redundancy Analysis for Memory Yield Improvement

Huang, C. T., Wu, C. F., Li, J. F. & Wu, C. W., 12月 2003, 於: IEEE Transactions on Reliability. 52, 4, p. 386-399 14 p.

研究成果: 雜誌貢獻 › 期刊論文 › 同行評審

161 引文斯高帕斯（Scopus）

Testing and diagnosis methodologies for embedded content addressable memories

Li, J. F., Tzeng, R. S. & Wu, C. W., 4月 2003, 於: Journal of Electronic Testing: Theory and Applications (JETTA). 19, 2, p. 207-215 9 p.

研究成果: 雜誌貢獻 › 期刊論文 › 同行評審

19 引文斯高帕斯（Scopus）

2002

A built-in self-test scheme with diagnostics support for embedded SRAM

Wang, C. W., Wu, C. F., Li, J. F., Wu, C. W., Teng, T., Chiu, K. & Lin, H. P., 12月 2002, 於: Journal of Electronic Testing: Theory and Applications (JETTA). 18, 6, p. 637-647 11 p.

研究成果: 雜誌貢獻 › 期刊論文 › 同行評審

16 引文斯高帕斯（Scopus）

A hierarchical test methodology for systems on chip

Li, J. F., Huang, H. J., Chen, J. B., Su, C. P., Wu, C. W., Cheng, C., Chen, S. I., Hwang, C. Y. & Lin, H. P., 9月 2002, 於: IEEE Micro. 22, 5, p. 69-81 13 p.

研究成果: 雜誌貢獻 › 期刊論文 › 同行評審

17 引文斯高帕斯（Scopus）