搜尋結果
2021
Cope Reaction
100%
Static random access storage
85%
Data storage equipment
46%
Testing
39%
logic
10%
2020
Hu, V. P. H. ,
Su, C. W. ,
Lee, Y. W. ,
Ho, T. Y. ,
Cheng, C. C. ,
Chen, T. C. ,
Hung, T. Y. T. ,
Li, J. F. ,
Chen, Y. G. &
Li, L. J. ,
10月 2020 ,
於: IEEE Transactions on Electron Devices. 67 ,
10 ,
p. 4216-4221 6 p. , 9184285.
研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
Static random access storage
100%
System-on-chip
91%
Resistance
56%
Percent Reduction
52%
Field effect transistors
27%
2018
International trade
100%
Hotels
83%
Tourism
83%
Integrated circuits
63%
Education
58%
2015
Redundancy
100%
Repair
96%
Data storage equipment
71%
Computer hardware
6%
2014
Built-in self test
100%
Data compression
87%
Data storage equipment
49%
Compressors
17%
Flash memory
100%
Testing
43%
Data storage equipment
7%
Three dimensional integrated circuits
100%
Data storage equipment
87%
Silicon
56%
Bandwidth
22%
2013
Random access storage
100%
Redundancy
77%
Repair
74%
Integrated circuit design
18%
Silicon
11%
Associative storage
100%
Repair
81%
Encoder
38%
Fault
33%
Built-in Self-test
28%
2012
Associative storage
100%
Short circuit currents
11%
Energy utilization
8%
Repair
100%
Integrated circuits
48%
Silicon
27%
Dynamic random access storage
20%
Electric fuses
18%
Random access storage
100%
Redundancy
77%
Repair
74%
Costs
34%
Networks (circuits)
10%
Random access storage
100%
Costs
34%
Data storage equipment
18%
Testing
15%
Associative storage
100%
Fault
84%
Ternary
57%
Cell
53%
Testing
51%
2011
Redundancy
100%
Data storage equipment
71%
Costs
44%
Repair
42%
Flow simulation
14%
Repair
100%
Planning
77%
Data storage equipment
74%
System-on-chip
33%
Networks (circuits)
17%
Soft Error
100%
Built-in Self-test
90%
Random Access
65%
Built-in self test
58%
Data storage equipment
28%
2010
Random access storage
100%
System-on-chip
93%
Repair
74%
Redundancy
11%
Automation
9%
Repair
100%
Defects
83%
Data storage equipment
74%
Electric fault location
12%
Networks (circuits)
12%
Repair
100%
Data storage equipment
74%
Redundancy
48%
Electric network analysis
8%
Costs
3%
Repair
100%
Data storage equipment
74%
Defects
35%
Networks (circuits)
28%
Costs
13%
Associative storage
100%
Testing
37%
Networks (circuits)
9%
Masks
8%
Defects
6%
Associative storage
100%
Defects
49%
Testing
37%
Networks (circuits)
19%
2009
Liu, H. N. ,
Huang, Y. J. &
Li, J. F. ,
9月 2009 ,
於: IEEE Micro. 29 ,
5 ,
p. 46-55 10 p. , 5325155.
研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
Built-in self test
100%
Random access storage
88%
Network-on-chip
60%
Data storage equipment
49%
Networks (circuits)
14%
2008
Redundancy
100%
Data storage equipment
71%
Repair
32%
Random access storage
28%
System-on-chip
100%
Data reduction
38%
Testing
33%
Costs
12%
2007
Fault
100%
Random access storage
94%
Fault Diagnosis
22%
Low Complexity
17%
Time Complexity
15%
Random access storage
100%
System-on-chip
93%
Data storage equipment
55%
Redundancy
44%
Static random access storage
43%
Huang, R. F. ,
Li, J. F. ,
Yeh, J. C. &
Wu, C. W. ,
2007 ,
於: IEEE Design and Test of Computers. 24 ,
4 ,
p. 386-396 11 p. 研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
Redundancy
100%
Repair
48%
Data storage equipment
23%
Flash memory
11%
Static random access storage
10%
Associative storage
100%
Testing
37%
Transistors
24%
Data storage equipment
17%
Semiconductor materials
12%
Associative storage
100%
Testing
37%
Networks (circuits)
26%
Transistors
20%
Defects
16%
Associative storage
100%
Testing
37%
Networks (circuits)
26%
Transistors
20%
Defects
16%
Error correction
100%
Data storage equipment
57%
2005
Li, J. F. ,
Yeh, J. C. ,
Huang, R. F. &
Wu, C. W. ,
6月 2005 ,
於: IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 13 ,
6 ,
p. 742-745 4 p. 研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
Random access storage
100%
Redundancy
77%
Repair
74%
Data storage equipment
33%
Built-in self test
22%
2004
Associative storage
100%
Random access storage
79%
Computer aided manufacturing
60%
System-on-chip
55%
Data storage equipment
44%
Connectivity
100%
Data storage equipment
66%
Verify
17%
Trajectory
17%
Evaluation
16%
2003
Huang, C. T. ,
Wu, C. F. ,
Li, J. F. &
Wu, C. W. ,
12月 2003 ,
於: IEEE Transactions on Reliability. 52 ,
4 ,
p. 386-399 14 p. 研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
Redundancy
100%
Data storage equipment
71%
Repair
57%
Built-in self test
29%
Electric network analysis
23%
Associative storage
100%
Testing
37%
Random access storage
26%
Built-in self test
14%
2002
Wang, C. W. ,
Wu, C. F. ,
Li, J. F. ,
Wu, C. W. ,
Teng, T. ,
Chiu, K. &
Lin, H. P. ,
12月 2002 ,
於: Journal of Electronic Testing: Theory and Applications (JETTA). 18 ,
6 ,
p. 637-647 11 p. 研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
Built-in self test
100%
Static random access storage
89%
Electric fault location
18%
Networks (circuits)
17%
Failure analysis
13%
Li, J. F. ,
Huang, H. J. ,
Chen, J. B. ,
Su, C. P. ,
Wu, C. W. ,
Cheng, C. ,
Chen, S. I. ,
Hwang, C. Y. &
Lin, H. P. ,
9月 2002 ,
於: IEEE Micro. 22 ,
5 ,
p. 69-81 13 p. 研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
Built-in self test
100%
Data compression
87%
Data storage equipment
49%
System-on-chip
41%
Compressors
34%
Fast Fourier transforms
100%
Testing
54%
Design for testability
48%
Computer hardware
30%
Fault tolerance
17%
2001
Wu, C. W. ,
Li, J. F. &
Huang, C. T. ,
11月 2001 ,
於: Journal of the Chinese Institute of Electrical Engineering, Transactions of the Chinese Institute of Engineers, Series E/Chung KuoTien Chi Kung Chieng Hsueh K'an. 8 ,
4 ,
p. 335-353 19 p. 研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
System-on-chip
100%
Testing
50%
Automation
37%
IEEE Standards
17%
Scheduling
11%
2000
Li, J. F. ,
Lu, S. K. ,
Hwang, S. A. &
Wu, C. W. ,
9月 2000 ,
於: IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing. 47 ,
9 ,
p. 919-929 11 p. 研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
Fast Fourier transforms
100%
VLSI circuits
20%
Computer hardware
20%
Fault tolerance
17%
Testing
9%