李 進福

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  運算記憶體之測試與可靠性增強技術-總計畫暨子計畫一：運算記憶體之測試策略與自動化技術(1/3)

  Li, J.-F. (PI)

  1/08/23 → 31/07/24

  研究計畫: Research

• 應用於運算記憶體之前瞻可靠度及測試框架-總計畫暨子計畫一：應用於運算記憶體之測試技術

  Li, J.-F. (PI)

  1/08/22 → 31/07/23

  研究計畫: Research

  • Random Access Memory 100%
  • In-memory Computing 66%
  • In-memory 66%
  • Age Detection 66%
  • Spin-transfer Torque Magnetic RAM (STT-MRAM) 66%

• 應用於人體姿勢辨識與機器人之可重組深度神經網路引擎－總計畫暨子計畫一： 應用於監督式學習之可重組深度神經網路技術(1/3)(3/3)

  Li, J.-F. (PI)

  1/08/21 → 31/07/22

  研究計畫: Research

  • In-memory Computing 100%
  • Computer Architecture 75%
  • Supervised Learning 50%
  • Reconfigurable 50%
  • Deep Neural Network 50%

• 深度神經網路系統之強健性與可靠性增強技術(3/3)

  Li, J.-F. (PI)

  1/08/21 → 31/07/22

  研究計畫: Research

  • In-memory Computing 100%
  • Computer Architecture 75%
  • Neural Network System 50%
  • Robustness Enhancement 50%
  • Enhancement Techniques 50%

• 高密度高效能半導體之關鍵元件與智慧架構開發(1/2)

  Li, J.-F. (PI)

  1/05/21 → 31/07/22

  研究計畫: Research

  • High Performance 100%
  • Artificial Intelligence 100%
  • In-memory 63%
  • High Density 36%
  • Technology Development 36%

• 深度神經網路系統之強健性與可靠性增強技術(2/3)

  Li, J.-F. (PI)

  1/08/20 → 31/07/21

  研究計畫: Research

  • Deep Neural Network 100%
  • Neural Network System 75%
  • In-memory Computing 50%
  • Static Random Access Memory 50%
  • 8T SRAM 50%

• 應用於人體姿勢辨識與機器人之可重組深度神經網路引擎－總計畫暨子計畫一： 應用於監督式學習之可重組深度神經網路技術(1/3)(2/3)

  Li, J.-F. (PI)

  1/08/20 → 31/07/21

  研究計畫: Research

  • Deep Neural Network 100%
  • In-memory Computing 50%
  • Static Random Access Memory 50%
  • 8T SRAM 50%
  • Error Correction Codes 50%

• 深度神經網路系統之強健性與可靠性增強技術(1/3)

  Li, J.-F. (PI)

  1/08/19 → 31/07/20

  研究計畫: Research

  • Robustness Enhancement 100%
  • Three-Dimensional ICs 100%
  • Enhancement Techniques 100%
  • Neural Network System 100%
  • Dynamic Random Access Memory 100%

• 應用於人體姿勢辨識與機器人之可重組深度神經網路引擎－總計畫暨子計畫一： 應用於監督式學習之可重組深度神經網路技術(1/3)(1/3)

  Li, J.-F. (PI)

  1/08/19 → 31/07/20

  研究計畫: Research

  • Reconfigurable 100%
  • Deep Neural Network 100%
  • Neural Network Method 100%
  • Supervised Learning 100%
  • Reconfigurable Techniques 37%

• 堆疊式記憶體測試與可靠度增強技術(3/3)

  Li, J.-F. (PI)

  1/08/18 → 31/07/19

  研究計畫: Research

  • In-memory Computing 100%
  • Static Random Access Memory 100%
  • Memory Array 65%
  • Computer Architecture 60%
  • Stacked Memory 50%

• 應用於物聯網之新興非揮發性記憶體測試技術(3/3)

  Li, J.-F. (PI)

  1/08/18 → 31/07/19

  研究計畫: Research

  • In-memory Computing 100%
  • Static Random Access Memory 100%
  • Test Algorithm 70%
  • Testing Algorithm 64%
  • Computer Architecture 60%

• 堆疊式記憶體測試與可靠度增強技術(2/3)

  Li, J.-F. (PI)

  1/08/17 → 31/07/18

  研究計畫: Research

  • Built-in Self Test 100%
  • Built-in-self-test (BiST) 86%
  • Comparison Faults 80%
  • Ternary Content Addressable Memory 80%
  • Multi-channel 80%

• 應用於物聯網之新興非揮發性記憶體測試技術(2/3)

  Li, J.-F. (PI)

  1/08/17 → 31/07/18

  研究計畫: Research

  • Built-in-self-test (BiST) 100%
  • build-in self-test 60%
  • Resistive 60%
  • Built-in Self Test 60%
  • Dynamic Random Access Memory 53%

• 堆疊式記憶體測試與可靠度增強技術(1/3)

  Li, J.-F. (PI)

  1/08/16 → 31/07/17

  研究計畫: Research

  • Stacked Memory 100%
  • Enhancement Techniques 100%
  • Reliability Enhancement 100%
  • Correction Code 100%
  • Design for Reliability 100%

• 應用於物聯網之新興非揮發性記憶體測試技術(1/3)

  Li, J.-F. (PI)

  1/08/16 → 31/07/17

  研究計畫: Research

  • Low Power Consumption 100%
  • Testing Algorithm 100%
  • Leakage Power 100%
  • Built-in-self-test (BiST) 100%
  • Non-volatile 100%

• 應用於三維積體電路可測性及可靠性設計技術-總計畫暨子計畫一：三維積體電路中堆疊式記憶體與晶粒間連接線可測性與可靠性技術

  Li, J.-F. (PI)

  1/05/15 → 31/07/16

  研究計畫: Research

  • Memristor 100%
  • Row-column 80%
  • 1T1R 80%
  • Boundary Currents 80%
  • Repair Scheme 80%