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會議論文篇章

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  • 1988

    BECOME: Behavior level circuit synthesis based on structure mapping.

    Wei, R. S., Rothweiler, S. & Jou, J. Y., 1988, Proceedings - Design Automation Conference. Publ by IEEE, p. 409-414 6 p. (Proceedings - Design Automation Conference).

    研究成果: 書貢獻/報告類型會議論文篇章同行評審

    3 引文 斯高帕斯(Scopus)
  • SLOPE: A test pattern generator based on stop line oriented path end algorithm

    Chuang, S. J., Lee, C. L., Shen, W. Z., Jen, C. W., Chen, J. E., Jing, S. C. & Chen, M. D., 1988, Proceedings - IEEE International Symposium on Circuits and Systems. Publ by IEEE, p. 437-439 3 p. (Proceedings - IEEE International Symposium on Circuits and Systems; 卷 1).

    研究成果: 書貢獻/報告類型會議論文篇章同行評審

    2 引文 斯高帕斯(Scopus)
  • Testable PLA design with low overhead and ease of test generation

    Jou, J. Y., 1988, 1988 IEEE Int Conf Comput Des VLSI Comput Process ICCD 88 Proc. Publ by IEEE, p. 450-453 4 p. (1988 IEEE Int Conf Comput Des VLSI Comput Process ICCD 88 Proc).

    研究成果: 書貢獻/報告類型會議論文篇章同行評審

  • 1985

    FAULT-TOLERANT FFT NETWORKS.

    Jou, J. Y. & Abraham, J. A., 1985, Digest of Papers - FTCS (Fault-Tolerant Computing Symposium). IEEE, p. 338-343 6 p. (Digest of Papers - FTCS (Fault-Tolerant Computing Symposium)).

    研究成果: 書貢獻/報告類型會議論文篇章同行評審

    17 引文 斯高帕斯(Scopus)
  • 1984

    BUILT-IN TEST FOR VLSI FINITE-STATE MACHINES.

    Hua, K. A., Jou, J. Y. & Abraham, J. A., 1984, Digest of Papers - FTCS (Fault-Tolerant Computing Symposium). IEEE, p. 292-297 6 p. (Digest of Papers - FTCS (Fault-Tolerant Computing Symposium)).

    研究成果: 書貢獻/報告類型會議論文篇章同行評審

    27 引文 斯高帕斯(Scopus)