Skip to main navigation Skip to search Skip to main content

Wide-range and area-selective threshold voltage tunability in ultrathin indium oxide transistors

  • Robert Tseng
  • , Sung Tsun Wang
  • , Tanveer Ahmed
  • , Yi Yu Pan
  • , Shih Chieh Chen
  • , Che Chi Shih
  • , Wu Wei Tsai
  • , Hai Ching Chen
  • , Chi Chung Kei
  • , Tsung Te Chou
  • , Wen Ching Hung
  • , Jyh Chen Chen
  • , Yi Hou Kuo
  • , Chun Liang Lin
  • , Wei Yen Woon
  • , Szuya Sandy Liao
  • , Der Hsien Lien

Research output: Contribution to journalArticlepeer-review

26 Scopus citations

Abstract

The scaling of transistors with thinner channel thicknesses has led to a surge in research on two-dimensional (2D) and quasi-2D semiconductors. However, modulating the threshold voltage (V T) in ultrathin transistors is challenging, as traditional doping methods are not readily applicable. In this work, we introduce a optical-thermal method, combining ultraviolet (UV) illumination and oxygen annealing, to achieve broad-range V T tunability in ultrathin In2O3. This method can achieve both positive and negative V T tuning and is reversible. The modulation of sheet carrier density, which corresponds to V T shift, is comparable to that obtained using other doping and capacitive charging techniques in other ultrathin transistors, including 2D semiconductors. With the controllability of V T, we successfully demonstrate the realization of depletion-load inverter and multi-state logic devices, as well as wafer-scale V T modulation via an automated laser system, showcasing its potential for low-power circuit design and non-von Neumann computing applications.

Original languageEnglish
Article number5243
JournalNature Communications
Volume14
Issue number1
DOIs
StatePublished - Dec 2023

Fingerprint

Dive into the research topics of 'Wide-range and area-selective threshold voltage tunability in ultrathin indium oxide transistors'. Together they form a unique fingerprint.

Cite this