Wavelength-modulated heterodyne speckle interferometry for displacement measurement

Ju Yi Lee, Kun Yi Lin, Szu Han Huang

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Scopus citations

Abstract

A heterodyne speckle interferometry for measurement of in-plane displacement is proposed. The wavelength-modulated (WM) laser beam passing through an unequal-path-length optical configuration is used as a heterodyne light source. The scattering heterodyne speckle signal is received by letting the WM heterodyne light incidents on the in-plane moving rough surface. The object displacement would be determined by the speckle interferometry theorem with the measured phase variation of the heterodyne speckle signal. The experimental results demonstrate that the measurement range is up to 10 μm and resolution is about 10 nm.

Original languageEnglish
Title of host publicationOptical Measurement Systems for Industrial Inspection VI
DOIs
StatePublished - 2009
EventOptical Measurement Systems for Industrial Inspection VI - Munich, Germany
Duration: 15 Jun 200918 Jun 2009

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume7389
ISSN (Print)0277-786X

Conference

ConferenceOptical Measurement Systems for Industrial Inspection VI
Country/TerritoryGermany
CityMunich
Period15/06/0918/06/09

Keywords

  • Heterodyne interferometry
  • In-plane displacement measurement
  • Laser diode
  • Optical metrology
  • Speckle interferometer
  • Wavelength-modulated

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