Visible Metasurfaces for On-Chip Polarimetry

Pin Chieh Wu, Jia Wern Chen, Chih Wei Yin, Yi Chieh Lai, Tsung Lin Chung, Chun Yen Liao, Bo Han Chen, Kuan Wei Lee, Chin Jung Chuang, Chih Ming Wang, Din Ping Tsai

Research output: Contribution to journalArticlepeer-review

115 Scopus citations


Measuring the polarization state of light and determining the optical properties of chiral materials are inherently complex issues because of the requirement of consequential measurements between different orthogonal states of polarization. Here, we introduce an on-chip polarimetry based on the visible metasurfaces for addressing the issue of polarization analysis with compact components. We demonstrate integrated metasurface chips can effectively determine a set of Stokes parameters covering a broad wave-band at visible light. For the proof of concept, the optical properties of chiral materials are measured using our proposed device, while experimental verifications are convincing by comparing with the data obtained from commercial ellipsometry.

Original languageEnglish
Pages (from-to)2568-2573
Number of pages6
JournalACS Photonics
Issue number7
StatePublished - 18 Jul 2018


  • aluminum plasmonics
  • on-chip polarimetry
  • polarization analysis
  • visible metasurfaces


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