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Using syndrome compression for memory built-in self-diagnosis
J. F. Li
, R. S. Tzeng, C. W. Wu
Department of Electrical Engineering
Research output
:
Contribution to conference
›
Paper
›
peer-review
11
Scopus citations
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Keyphrases
Built-in Self-Diagnosis
100%
Compression Techniques
66%
Coding Scheme
33%
Diagnostic Test
33%
Tree-based
33%
16-bit
33%
Post-diagnostic Support
33%
Compression Ratio
33%
Storage Requirement
33%
Huffman Coding
33%
Diagnostic Time
33%
Engineering
Reliability Availability and Maintainability (Reliability Engineering)
100%
Compression Technique
100%
Coding Scheme
50%
Compression Ratio
50%
Storage Requirement
50%
Bit Symbol
50%
Computer Science
Compression Technique
100%
Speed-up
50%
Compression Ratio
50%
Storage Requirement
50%
Huffman Coding
50%