Using syndrome compression for memory built-in self-diagnosis

J. F. Li, R. S. Tzeng, C. W. Wu

Research output: Contribution to conferencePaperpeer-review

9 Scopus citations

Abstract

Due to the pin-count limitation, built-in self-diagnosis (BISD) for embedded RAMs usually exports diagnosis information serially, which results in the overhead of diagnostic time. This paper describes a tree-based compression technique for word-oriented memories. The technique can speed up the transmission of diagnosis data from the embedded RAM with BISD support. By using a simplified Huffman coding scheme and partitioning each 256-bit Hamming syndrome into fixed-size symbols, the average compression ratio is reduced to about 10%, assuming 16-bit symbols. The proposed compression technique reduces the time for diagnostic test, as well as the tester storage requirement.

Original languageEnglish
Pages303-306
Number of pages4
StatePublished - 2001
Event2001 International Symposium on VLSI Technology, Systems, and Applications, Proceedings - Hsinchu, Taiwan
Duration: 18 Apr 200120 Apr 2001

Conference

Conference2001 International Symposium on VLSI Technology, Systems, and Applications, Proceedings
Country/TerritoryTaiwan
CityHsinchu
Period18/04/0120/04/01

Fingerprint

Dive into the research topics of 'Using syndrome compression for memory built-in self-diagnosis'. Together they form a unique fingerprint.

Cite this