Abstract
Due to the pin-count limitation, built-in self-diagnosis (BISD) for embedded RAMs usually exports diagnosis information serially, which results in the overhead of diagnostic time. This paper describes a tree-based compression technique for word-oriented memories. The technique can speed up the transmission of diagnosis data from the embedded RAM with BISD support. By using a simplified Huffman coding scheme and partitioning each 256-bit Hamming syndrome into fixed-size symbols, the average compression ratio is reduced to about 10%, assuming 16-bit symbols. The proposed compression technique reduces the time for diagnostic test, as well as the tester storage requirement.
| Original language | English |
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| Pages | 303-306 |
| Number of pages | 4 |
| State | Published - 2001 |
| Event | 2001 International Symposium on VLSI Technology, Systems, and Applications, Proceedings - Hsinchu, Taiwan Duration: 18 Apr 2001 → 20 Apr 2001 |
Conference
| Conference | 2001 International Symposium on VLSI Technology, Systems, and Applications, Proceedings |
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| Country/Territory | Taiwan |
| City | Hsinchu |
| Period | 18/04/01 → 20/04/01 |