Using moire method of measuring optical disks

Ter Chin Cheng, Sheng Nan Jiang, Rong Seng Chang

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

A primary function of compact disk measuring systems is the measurement of various types of defects which represent either functional or cosmetic flaws and the measurement of the profile of the compact disk. Functional flaws can make a very bad interference with the reproduction of the recorded music. Cosmetic flaws are visual imperfections whose presence can cause the rejecting of the disc by the production line. A projection moire method is invented in which a light beam passes through a grating, and is projected onto the object by overlapping with the virtual grating in the computer software. The object's 3-dimensional profile will be reconstructed and the object's profile quality can be improved by our new method for moire image processing.

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
PublisherPubl by Int Soc for Optical Engineering
Pages95-101
Number of pages7
ISBN (Print)0819409251
StatePublished - 1992
EventCurrent Developments in Optical Design and Optical Engineering II - San Diego, CA, USA
Duration: 20 Jul 199221 Jul 1992

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume1752
ISSN (Print)0277-786X

Conference

ConferenceCurrent Developments in Optical Design and Optical Engineering II
CitySan Diego, CA, USA
Period20/07/9221/07/92

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