TSG - A test system generator for debugging and regression test of high-level behavioral synthesis tools

R. Ernst, S. Sutarwala, J. Y. Jou

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The authors present a simulation-based system for testing high-level behavioral synthesis tools. Applications are tool debugging and automatic regression test. A key feature is a transformation of sequential circuits for application of random test patterns.

Original languageEnglish
Title of host publication20 Int Test Conf 1989 ITC
Editors Anon
PublisherPubl by IEEE
Pages937
Number of pages1
ISBN (Print)0818689625
StatePublished - 1989
Event20th International Test Conference 1989 (ITC) - Washington, DC, USA
Duration: 29 Aug 198931 Aug 1989

Publication series

Name20 Int Test Conf 1989 ITC

Conference

Conference20th International Test Conference 1989 (ITC)
CityWashington, DC, USA
Period29/08/8931/08/89

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