Transparent-test methodologies for random access memories without/with ECC

Jin Fu Li

doi:10.1109/TCAD.2007.895772

Transparent-test methodologies for random access memories without/with ECC

Jin Fu Li

Department of Electrical Engineering

Research output: Contribution to journal › Article › peer-review

8 Scopus citations

Abstract

This paper presents a systematic procedure for transforming a bit-oriented March test into a transparent word-oriented March test. The test-time complexity of the transparent word-oriented March tests converted by the proposed method is only (P + 5 log₂ B + 2) N for an N × B-bit Random Access Memory, and the test-time complexity of the corresponding signature-prediction test is QN. Here, P and Q denote the number of total Read/Write and Read test operations of the original bit-oriented March test. A transparent-test methodology for memories with error-correction code (ECC) is also proposed. This methodology can test and locate faulty cells, and no signature prediction is needed. The test-time complexity of the proposed transparent-test methodology for memories with ECC is only (P + 5 log₂ B + 2)N.

Original language	English
Pages (from-to)	1888-1893
Number of pages	6
Journal	IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Volume	26
Issue number	10
DOIs	https://doi.org/10.1109/TCAD.2007.895772
State	Published - Oct 2007

Keywords

Error-correction code (ECC)
March test
Random-access memory (RAM)
Reliability
Soft errors
Transparent test

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10.1109/TCAD.2007.895772

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title = "Transparent-test methodologies for random access memories without/with ECC",

abstract = "This paper presents a systematic procedure for transforming a bit-oriented March test into a transparent word-oriented March test. The test-time complexity of the transparent word-oriented March tests converted by the proposed method is only (P + 5 log2 B + 2) N for an N × B-bit Random Access Memory, and the test-time complexity of the corresponding signature-prediction test is QN. Here, P and Q denote the number of total Read/Write and Read test operations of the original bit-oriented March test. A transparent-test methodology for memories with error-correction code (ECC) is also proposed. This methodology can test and locate faulty cells, and no signature prediction is needed. The test-time complexity of the proposed transparent-test methodology for memories with ECC is only (P + 5 log2 B + 2)N.",

keywords = "Error-correction code (ECC), March test, Random-access memory (RAM), Reliability, Soft errors, Transparent test",

author = "Li, {Jin Fu}",

note = "Funding Information: Manuscript received August 31, 2006; revised December 3, 2006. This work was supported in part by the National Science Council, Taiwan, R.O.C., under Contract NSC 95-2221-E-008-152 and in part by MOEA, Taiwan, R.O.C., under Contract 96-EC-17-A-01-S1-002. This paper was recommended by Associate Editor K. Chakrabarty.",

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N2 - This paper presents a systematic procedure for transforming a bit-oriented March test into a transparent word-oriented March test. The test-time complexity of the transparent word-oriented March tests converted by the proposed method is only (P + 5 log2 B + 2) N for an N × B-bit Random Access Memory, and the test-time complexity of the corresponding signature-prediction test is QN. Here, P and Q denote the number of total Read/Write and Read test operations of the original bit-oriented March test. A transparent-test methodology for memories with error-correction code (ECC) is also proposed. This methodology can test and locate faulty cells, and no signature prediction is needed. The test-time complexity of the proposed transparent-test methodology for memories with ECC is only (P + 5 log2 B + 2)N.

AB - This paper presents a systematic procedure for transforming a bit-oriented March test into a transparent word-oriented March test. The test-time complexity of the transparent word-oriented March tests converted by the proposed method is only (P + 5 log2 B + 2) N for an N × B-bit Random Access Memory, and the test-time complexity of the corresponding signature-prediction test is QN. Here, P and Q denote the number of total Read/Write and Read test operations of the original bit-oriented March test. A transparent-test methodology for memories with error-correction code (ECC) is also proposed. This methodology can test and locate faulty cells, and no signature prediction is needed. The test-time complexity of the proposed transparent-test methodology for memories with ECC is only (P + 5 log2 B + 2)N.

KW - Error-correction code (ECC)

KW - March test

KW - Random-access memory (RAM)

KW - Reliability

KW - Soft errors

KW - Transparent test

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DO - 10.1109/TCAD.2007.895772

M3 - 期刊論文

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VL - 26

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EP - 1893

JO - IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

JF - IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

IS - 10

ER -

Transparent-test methodologies for random access memories without/with ECC

Abstract

Keywords

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